Topography and friction properties of macromolecular thin films using atomic-force-microscopy technology

被引：0
|
作者：
Y.W. Chen
D.J. Gan
S. Kreiling
C.S. Song
S.Q. Lu
Z.J. Wang
机构：
[1] Department of Chemistry,
[2] Jiangxi Normal University,undefined
[3] 330027 Nanchang,undefined
[4] P.R. China,undefined
来源：
Applied Physics A | 2003年 / 76卷
关键词：
PACS: 07.79.Lh; 62.20.Qp; 81.05.Lg; 81.20.Ka; 81.40.Pq;
D O I：
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学科分类号：
摘要：
The research work in this letter is on the microtribological properties of poly(ether ketone ketone) (PEKK) and sulfonated PEKK (S-PEKK) thin films. Polystyrene (PS) was used as a reference for the investigation. Atomic-force-microscopy (AFM) techniques were used for observing the topography and friction properties of the macromolecular thin films at the nanometer scale. The polymeric thin films were fabricated by spin coating at a speed of 4000 rotations per minute (rpm).
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页码：129 / 132
页数：3
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