Characterization of thin metastable vanadium oxide films by Raman spectroscopy

被引：0
|
作者：
J. P. Schreckenbach
Klaus Witke
Diethard Butte
Günter Marx
机构：
[1] Institut für Chemie,
[2] Technische Universität Chemnitz,undefined
[3] D-09107 Chemnitz,undefined
[4] Bundesanstalt für Materialforschung und -prüfung Berlin,undefined
[5] D-12200 Berlin,undefined
来源：
Fresenius' Journal of Analytical Chemistry | 1999年 / 363卷
关键词：
Vanadium; Raman Spectroscopy; Oxide Film; V2O5; Laser Excitation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Thin films are potentiodynamically generated on vanadium in Ba2+/acetate electrolyte systems at high voltages. The influence of the anodic potential up to 400 V on the composition and structure of the about 500 nm thin anodic conversion films are investigated. Raman spectroscopy indicates that different film types depend on the electrochemical process parameters. The relationship between the Raman laser excitation power and the amorphous or microcrystalline film structure is also discussed. Beside metastable disordered structures the films contain crystalline phases of V2O5, V4O9 and barium vanadate, respectively.
引用
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页码：211 / 214
页数：3
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