Huygens' Methods for Determining Optical Parameters in Birefringence

被引：0
|
作者：
Jed Z. Buchwald
机构：
[1] California Institute of Technology,
来源：
Archive for History of Exact Sciences | 2007年 / 61卷
关键词：
Refraction; Huygens; Refraction Angle; Vertical Edge; Interfacial Angle;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：67 / 81
页数：14
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