Huygens' Methods for Determining Optical Parameters in Birefringence

被引：0

作者：

Jed Z. Buchwald

机构：

[1] California Institute of Technology,

来源：

Archive for History of Exact Sciences | 2007年 / 61卷

关键词：

Refraction; Huygens; Refraction Angle; Vertical Edge; Interfacial Angle;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：67 / 81

页数：14

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