Sidewall slopes and roughness of SU-8 HARMST

被引:0
|
作者
K. D. Vora
B.-Y. Shew
B. Lochel
E. C. Harvey
J. P. Hayes
A. G. Peele
机构
[1] La Trobe University,Department of Physics
[2] National Synchrotron Radiation Research Center,Device Technology Group
[3] Application Center for Micro Engineering,Industrial Research Institute of Swinburne
[4] BESSY,undefined
[5] Swinburne University of Technology,undefined
来源
Microsystem Technologies | 2008年 / 14卷
关键词
PMMA; Crosslink Density; Exposure Dose; Sherwood Number; Dimensional Error;
D O I
暂无
中图分类号
学科分类号
摘要
In recent years we have investigated the feasibility of deep X-ray lithography in SU-8 as a means of fabricating very high aspect ratio and densely packed arrays of square channels. We have demonstrated how to overcome the problems in adhesion and stiction accompanying the fabrication of such high aspect ratio structures. We have also examined how to calculate the development time of these structures and how this can be used to optimize the dimensional fidelity of the resulting structures. More recently we have considered the effect of the non-uniform dose deposition and beam hardening as a function of depth in the resist on factors such as the surface roughness and the sidewall taper. In this paper we describe our experimental program, review these results and discuss their implications for the operation of our target device—the lobster-eye telescope.
引用
收藏
页码:1701 / 1708
页数:7
相关论文
共 50 条
  • [1] Sidewall slopes and roughness of SU-8 HARMST
    K. D. Vora
    B.-Y. Shew
    B. Lochel
    E. C. Harvey
    J. P. Hayes
    A. G. Peele
    Microsystem Technologies, 2008, 14 (9-11) : 1777 - 1777
  • [2] Sidewall slopes and roughness of SU-8HARMST
    Vora, K. D.
    Shew, B. -Y.
    Lochel, B.
    Harvey, E. C.
    Hayes, J. P.
    Peele, A. G.
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2008, 14 (9-11): : 1701 - 1708
  • [3] Sidewall slopes of SU-8HARMST using deep x-ray lithography
    Vora, K. D.
    Shew, B. Y.
    Harvey, E. C.
    Hayes, J. P.
    Peele, A. G.
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2008, 18 (03)
  • [4] Sidewall roughness characterization and comparison between silicon and SU-8 microcomponents
    Lee, C. H.
    Jiang, K.
    Davies, G. J.
    MATERIALS CHARACTERIZATION, 2007, 58 (07) : 603 - 609
  • [5] Synthesis of Metal/SU-8 Nanocomposites through Photoreduction on SU-8 Substrates
    Huang, Yan-Jun
    Chang, Wen-Huei
    Chen, Yi-Jui
    Lin, Chun-Hung
    NANOMATERIALS, 2023, 13 (11)
  • [6] Study of SU-8 to make a Ni master-mold: Adhesion, sidewall profile, and removal
    Kim, Sung-Jin
    Yang, Haesik
    Kim, Kyuwon
    Lim, Yong Taik
    Pyo, Hyeon-Bong
    ELECTROPHORESIS, 2006, 27 (16) : 3284 - 3296
  • [7] Chemical synthesis on SU-8
    Qvortrup, Katrine
    Taveras, Kennedy
    Nielsen, Thomas E.
    Thastrup, Ole
    Morgan, Hywel
    Birtwell, Sam
    Broder, Graham R.
    Roach, Peter
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2010, 240
  • [8] Electrowriting of SU-8 Microfibers
    Salaiza, Diego Armando Sandoval
    Valsangiacomo, Nico
    Dinc, Niyazi Ulas
    Yildirim, Mustafa
    Madrid-Wolff, Jorge
    Bertsch, Arnaud
    Jiguet, Sebastien
    Dalton, Paul D.
    Brugger, Juergen
    Moser, Christophe
    POLYMERS, 2024, 16 (12)
  • [9] Mechanical properties of SU-8
    McAleavey, A
    Coles, G
    Edwards, RL
    Sharpe, WN
    MATERIALS SCIENCE OF MICROELECTROMECHANICAL SYSTEMS (MEMS) DEVICES, 1999, 546 : 213 - 218
  • [10] SU-8 Resonator Antenna
    Rashidian, A.
    Klymyshyn, D. M.
    Aligodarz, M. Tayfeh
    Boerner, M.
    Mohr, J.
    2010 IEEE ANTENNAS AND PROPAGATION SOCIETY INTERNATIONAL SYMPOSIUM, 2010,