Extraction of admittance parameters of symmetrically doped AlGaN/GaN/AlGaN DH-HEMT for microwave frequency applications

被引:0
|
作者
Nisha Chugh
Manoj Kumar
Monika Bhattacharya
R. S. Gupta
机构
[1] Communication and Technology,University School of Information
[2] Guru Gobind Singh Indraprastha University,Department of Electronics, Acharya Narendra Dev College
[3] University of Delhi,Department of Electronics and Communication Engineering
[4] Maharaja Agrasen Institute of Technology,undefined
来源
Microsystem Technologies | 2021年 / 27卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
An analytical model for determining intrinsic short-circuit admittance (Y) parameters of AlGaN/GaN/AlGaN Double Heterostructure (DH) High Electron Mobility Transistor (HEMT) is presented. These Y parameters obtained in terms of the various small signal equivalent circuit parameters are in turn used to evaluate the enhanced microwave performance of the DH-HEMT in terms of various parameters including Unilateral Power Gain and maximum oscillation frequency. The cut-off frequency has been evaluated from short circuit current gain. The cut-off frequency (fT) and maximum oscillation frequency (fmax) exhibited for DH-HEMT is 125 GHz and 215 GHz which is comparatively improved as obtained in Single Heterostructure (SH) HEMT (fT = 105 GHz and fmax = 165 GHz). The analytical results obtained for DH and SH-HEMT; have been compared and found to match well with the ATLAS 2D device simulation results thus proving the validity of the model.
引用
收藏
页码:4065 / 4072
页数:7
相关论文
共 50 条
  • [21] Extraction of AlGaN/GaN HEMT Gauge Factor in the Presence of Traps
    Koehler, Andrew D.
    Gupta, Amit
    Chu, Min
    Parthasarathy, Srivatsan
    Linthicum, Kevin J.
    Johnson, J. Wayne
    Nishida, Toshikazu
    Thompson, Scott E.
    IEEE ELECTRON DEVICE LETTERS, 2010, 31 (07) : 665 - 667
  • [22] Switching Transient Analysis and Characterization of an E-Mode B-Doped GaN-Capped AlGaN DH-HEMT with a Freewheeling Schottky Barrier Diode (SBD)
    Subramanian, Baskaran
    Anandan, Mohanbabu
    Veerappan, Saminathan
    Panneerselvam, Murugapandiyan
    Wasim, Mohammed
    Radhakrishnan, Saravana Kumar
    Pechimuthu, Praveen
    Verma, Yogesh Kumar
    Vivekanandhan, Subash Navaneethan
    Raju, Elamurugan
    JOURNAL OF ELECTRONIC MATERIALS, 2020, 49 (07) : 4091 - 4099
  • [23] Gate-First AlGaN/GaN HEMT Technology for High-Frequency Applications
    Saadat, Omair I.
    Chung, Jinwook W.
    Piner, Edwin L.
    Palacios, Tomas
    IEEE ELECTRON DEVICE LETTERS, 2009, 30 (12) : 1254 - 1256
  • [24] High Frequency Characterization and Properties of AlGaN/GaN HEMT Structures
    Tomaska, M.
    Lalinsky, T.
    Vanko, G.
    Misun, M.
    ASDAM 2008, CONFERENCE PROCEEDINGS, 2008, : 331 - +
  • [25] Low-frequency noise characteristics of AlGaN/GaN HEMT
    Makihara, H
    Akita, M
    Ohno, Y
    Kishimoto, S
    Maezawa, K
    Mizutani, T
    COMPOUND SEMICONDUCTORS 2001, 2002, (170): : 113 - 117
  • [26] Optimization of the parameters of HEMT GaN/AlN/AlGaN heterostructures for microwave transistors using numerical simulation
    V. G. Tikhomirov
    V. E. Zemlyakov
    V. V. Volkov
    Ya. M. Parnes
    V. N. Vyuginov
    W. V. Lundin
    A. V. Sakharov
    E. E. Zavarin
    A. F. Tsatsulnikov
    N. A. Cherkashin
    M. N. Mizerov
    V. M. Ustinov
    Semiconductors, 2016, 50 : 244 - 248
  • [27] Optimization of the Parameters of HEMT GaN/AlN/AlGaN Heterostructures for Microwave Transistors Using Numerical Simulation
    Tikhomirov, V. G.
    Zemlyakov, V. E.
    Volkov, V. V.
    Parnes, Ya. M.
    Vyuginov, V. N.
    Lundin, W. V.
    Sakharov, A. V.
    Zavarin, E. E.
    Tsatsulnikov, A. F.
    Cherkashin, N. A.
    Mizerov, M. N.
    Ustinov, V. M.
    SEMICONDUCTORS, 2016, 50 (02) : 244 - 248
  • [28] A new nonlinear HEMT model for AlGaN/GaN switch applications
    Jardel, O.
    Callet, G.
    Charbonniaud, C.
    Jacquet, J. C.
    Sarazin, N.
    Morvan, E.
    Aubry, R.
    Poisson, M. -A. Di Forte
    Teyssier, J. -P.
    Piotrowicz, S.
    Quere, R.
    2009 EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC 2009), 2009, : 73 - +
  • [29] Strain sensitivity of AlGaN/GaN HEMT structures for sensing applications
    Yilmazoglu, Oktay
    Mutamba, Kabula
    Pavlidis, Dimitris
    Mbarga, Marie Rose
    IEICE TRANSACTIONS ON ELECTRONICS, 2006, E89C (07) : 1037 - 1041
  • [30] A new nonlinear HEMT model for AlGaN/GaN switch applications
    Callet, Guillaume
    Faraj, Jad
    Jardel, Olivier
    Charbonniaud, Christophe
    Jacquet, Jean-Claude
    Reveyrand, Tibault
    Morvan, Erwan
    Piotrowicz, Stephane
    Teyssier, Jean-Pierre
    Quere, R.
    INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES, 2010, 2 (3-4) : 283 - 291