Chiral exchange drag and chirality oscillations in synthetic antiferromagnets
被引:0
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作者:
See-Hun Yang
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机构:IBM Research - Almaden,
See-Hun Yang
Chirag Garg
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h-index: 0
机构:IBM Research - Almaden,
Chirag Garg
Stuart S. P. Parkin
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机构:IBM Research - Almaden,
Stuart S. P. Parkin
机构:
[1] IBM Research - Almaden,
[2] Max Planck Institute for Microstructure Physics,undefined
来源:
Nature Physics
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2019年
/
15卷
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摘要:
Long-range interactions between quasiparticles give rise to a ‘drag’ that affects the fundamental properties of many systems in condensed matter physics1–11. Drag typically involves the exchange of linear momentum between quasiparticles and strongly influences their transport properties. Here, we describe a kind of drag that involves the exchange of angular momentum between two current-driven magnetic domain walls. The motions of the domain walls are correlated and determined by the strength of the drag. When the drag is below a threshold value, the domain walls move together at a constant intermediate velocity with a steady leakage of angular momentum from the faster to the slower wall. However, we find that when the drag exceeds a threshold value, a different dynamic can take place in which the faster domain wall’s magnetization oscillates synchronously with a precessional motion of the slower domain wall’s magnetization, and angular momentum is continuously transferred between them. Our findings demonstrate a method for delivering spin angular momentum remotely to magnetic entities that otherwise could not be manipulated directly by current, for example, by coupling domain walls or other non-collinear spin textures in metallic and insulating media.
机构:
Korea Inst Sci & Technol, Future Technol Res Div, Seoul 130650, South KoreaKorea Inst Sci & Technol, Future Technol Res Div, Seoul 130650, South Korea
Uhm, YR
Lim, SH
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机构:
Korea Inst Sci & Technol, Future Technol Res Div, Seoul 130650, South KoreaKorea Inst Sci & Technol, Future Technol Res Div, Seoul 130650, South Korea
机构:
Korea Inst Sci & Technol, Thin Film Technol Res Ctr, Seoul 130650, South KoreaKorea Inst Sci & Technol, Thin Film Technol Res Ctr, Seoul 130650, South Korea
Uhm, YR
Lim, SH
论文数: 0引用数: 0
h-index: 0
机构:
Korea Inst Sci & Technol, Thin Film Technol Res Ctr, Seoul 130650, South KoreaKorea Inst Sci & Technol, Thin Film Technol Res Ctr, Seoul 130650, South Korea