Comparison of Characteristics of Thin PZT Films on Si-on-Sapphire and Si Substrates

被引:0
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作者
L. A. Delimova
N. V. Zaitseva
V. V. Ratnikov
V. S. Yuferev
D. S. Seregin
K. A. Vorotilov
A. S. Sigov
机构
[1] Ioffe Institute,
[2] MIREA—Russian Technological University,undefined
来源
关键词
ferroelectric films; PZT; nonswitchable polarization; hysteresis loops; current–voltage characteristics; photoelectric current; mechanical deformations and stresses;
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页码:1145 / 1152
页数:7
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