Surface characterization of an ultra-soft contact lens material using an atomic force microscopy nanoindentation method

被引:0
|
作者
Vinay Sharma
Xinfeng Shi
George Yao
George M. Pharr
James Yuliang Wu
机构
[1] Alcon Research,Department of Materials Science and Engineering
[2] LLC,undefined
[3] Alcon Research,undefined
[4] LLC,undefined
[5] Texas A&M University,undefined
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
As new ultra-soft materials are being developed for medical devices and biomedical applications, the comprehensive characterization of their physical and mechanical properties is both critical and challenging. To characterize the very low surface modulus of the novel biomimetic lehfilcon A silicone hydrogel contact lens coated with a layer of a branched polymer brush structure, an improved atomic force microscopy (AFM) nanoindentation method has been applied. This technique allows for precise contact-point determination without the effects of viscous squeeze-out upon approaching the branched polymer. Additionally, it allows individual brush elements to be mechanically characterized in the absence of poroelastic effects. This was accomplished by selecting an AFM probe with a design (tip size, geometry, and spring constant) that was especially suited to measuring the properties of soft materials and biological samples. The enhanced sensitivity and accuracy of this method allows for the precise measurement of the very soft lehfilcon A material, which has an extremely low elastic modulus in the surface region (as low as 2 kPa) and extremely high elasticity (nearly 100%) in an aqueous environment. The surface-characterization results not only reveal the ultra-soft nature of the lehfilcon A lens surface but also demonstrate that the elastic modulus exhibits a 30 kPa/200 nm gradient with depth due to the disparity between the modulus of the branched polymer brushes and the SiHy substrate. This surface-characterization methodology may be applied to other ultra-soft materials and medical devices.
引用
收藏
相关论文
共 50 条
  • [31] Atomic force microscopy analysis of the effect of plasma treatment on gas permeable contact lens surface topography
    Gill, Felicity R.
    Purslow, Christine
    Murphy, Paul J.
    CONTACT LENS & ANTERIOR EYE, 2019, 42 (03): : 265 - 272
  • [32] Advanced Characterization of Material Properties on the Nanometer Scale Using Atomic Force Microscopy
    Fenner, M. A.
    Wu, S.
    Yu, J. -J.
    Huber, H. -P.
    Kienberger, F.
    ACTA PHYSICA POLONICA A, 2012, 121 (02) : 416 - 419
  • [33] Evaluation of the contact resonance frequencies in atomic force microscopy as a method for surface characterisation (invited)
    Rabe, U
    Kopycinska, M
    Hirsekorn, S
    Arnold, W
    ULTRASONICS, 2002, 40 (1-8) : 49 - 54
  • [34] Analysis of the healthy rabbit lens surface using MAC mode atomic force microscopy
    Antunes, A.
    Gozzo, F. V.
    Nakamura, M.
    Safatle, A. M. V.
    Morelhao, S. L.
    Toma, H. E.
    Barros, P. S. M.
    MICRON, 2007, 38 (03) : 286 - 290
  • [35] Nanoindentation of Pseudomonas aeruginosa bacterial biofilm using atomic force microscopy
    Baniasadi, Mahmoud
    Xu, Zhe
    Gandee, Leah
    Du, Yingjie
    Lu, Hongbing
    Zimmern, Philippe
    Minary-Jolandan, Majid
    MATERIALS RESEARCH EXPRESS, 2014, 1 (04)
  • [36] Characterization method of polycrystalline materials using conductive atomic force microscopy
    Ding Xi-Dong
    Fu Gang
    Xiong Xiao-Min
    Zhang Jin-Xiu
    CHINESE PHYSICS LETTERS, 2008, 25 (10) : 3597 - 3600
  • [37] Characterization of intermittent contact in tapping mode atomic force microscopy
    Zhao, Xiaopeng
    Dankowicz, Harry
    PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, VOL 6, PTS A-C, 2005, : 2011 - 2020
  • [38] Imaging of soft matter with tapping-mode atomic force microscopy and non-contact-mode atomic force microscopy
    Yang, Chih-Wen
    Hwang, Ing-Shouh
    Chen, Yen Fu
    Chang, Chia Seng
    Tsai, Din Ping
    NANOTECHNOLOGY, 2007, 18 (08)
  • [39] Use of contact-atomic force microscopy in plastic material surfaces
    Reyes, E
    Guerrero, C
    ANTEC 2000: SOCIETY OF PLASTICS ENGINEERS TECHNICAL PAPERS, CONFERENCE PROCEEDINGS, VOLS I-III, 2000, : 3631 - 3634
  • [40] Local surface cleaning and cluster assembly using contact mode atomic force microscopy
    Yang, DQ
    Sacher, E
    APPLIED SURFACE SCIENCE, 2003, 210 (3-4) : 158 - 164