Static and in-situ high-resolution transmission electron microscopy investigations of the atomic structure and dynamics of massive transformation interfaces in a Ti-Al alloy

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作者
James M. Howe
William T. Reynolds
Vijay K. Vasudevan
机构
[1] University of Virginia,the Department of Materials Science and Engineering
[2] Virginia Polytechnic Institute and State University,the Department of Materials Science and Engineering
[3] University of Cincinnati,the Department of Materials Science and Engineering
关键词
Material Transaction; HRTEM; Orientation Relationship; HRTEM Image; Interphase Boundary;
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摘要
Static and in-situ high-resolution transmission electron microscopy (HRTEM) and three-dimensional near-coincident-site (NCS) atomic modeling were used to determine the atomic structure, growth mechanisms, and dynamics of massive transformation interfaces in a Ti-Al alloy. Results from these experiments show that massive γM grains often have an irrational orientation relationship (OR) and structurally incommensurate (incoherent) interface with respect to the parent α (retained α2) phase, although the degree of commensurability varies, depending on the orientation and planarity of a particular α2/γM interface. In-situ HRTEM observations of several α2/γM interfaces during growth revealed evidence of both continuous and stepwise mechanisms of interface motion, again, depending on the orientation of the interface plane for a given OR between the two phases. These findings are discussed within the contex of the massive transformation and the motion of interphase boundaries in solids.
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页码:2391 / 2411
页数:20
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