Direct Patterning of Ionic Polymers with E-Beam Lithography

被引:0
|
作者
Annina M. Steinbach
Stefan Jenisch
Parisa Bakhtiarpour
Masoud Amirkhani
Steffen Strehle
机构
[1] Ulm University,Institute of Electron Devices and Circuits
[2] Ulm University,Institute of Experimental Physics
关键词
D O I
10.1557/adv.2016.66
中图分类号
学科分类号
摘要
Controlling the bending properties of ionic polymer-metal composites may immediately affect their implementation in robotics and medicine. In the present work, we propose a direct patterning method for the ionic polymer Nafion using conventional electron-beam writing. In a proof-of-concept study, we show that patterns of arbitrary geometry and sizes between 1 μm and 50 μm can be engraved into the polymer surface without using resists. Pattern depth can be deliberately controlled by adjusting the exposure dose. The patterns were stable even after prolonged immersion in ionic solution. The presented technique therefore opens up the possibility to create unique electrode geometries and to investigate independently the effect of pattern size, density, depth as well as geometry on ionic polymer-metal composite bending.
引用
收藏
页码:45 / 50
页数:5
相关论文
共 50 条
  • [41] COMPUTER-AIDED PROXIMITY CORRECTION FOR DIRECT WRITE E-BEAM LITHOGRAPHY
    KNAPEK, E
    KALUS, CK
    MADORE, M
    HINTERMAIER, M
    HOFMANN, U
    SCHERERWINNER, H
    SCHLAGER, R
    MICROELECTRONIC ENGINEERING, 1991, 13 (1-4) : 181 - 184
  • [42] DIRECT E-BEAM LITHOGRAPHY AT 60 KV ON SUBSTRATES WITH STEPS AND DIFFERENT MATERIALS
    SACKETT, JN
    AHMED, H
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (06) : C234 - C234
  • [43] Resist-Free E-beam Lithography for Patterning Nanoscale Thick Films on Flexible Substrates
    Xomalis, Angelos
    Hain, Caroline
    Groetsch, Alexander
    Klimashin, Fedor F.
    Nelis, Thomas
    Michler, Johann
    Schwiedrzik, Jakob
    ACS APPLIED NANO MATERIALS, 2023, 6 (05) : 3388 - 3394
  • [44] Patterning of hyperbranched resist materials by e-beam
    Trimble, AR
    Tully, DC
    Fréchet, JMJ
    Medeiros, DR
    Angelopoulos, M
    ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XVII, PTS 1 AND 2, 2000, 3999 : 1198 - 1201
  • [45] A Study of Conductive Material for E-beam Lithography
    Wang, Wen-Yun
    Liu, Chen-Yu
    Chien, Tsung-Chih
    Huang, Chun-Ching
    Lin, Shy-Jay
    Chang, Ya-Hui
    Chen, Jack J. H.
    Chang, Ching-Yu
    Ku, Yao-Ching
    Lin, Burn J.
    ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXVIII, 2011, 7972
  • [46] E-beam lithography for micro-/nanofabrication
    Altissimo, Matteo
    BIOMICROFLUIDICS, 2010, 4 (02):
  • [47] E-BEAM PATTERNING BY A DOUBLE EXPOSURE PROCESS
    LALANNE, F
    WEILL, A
    AMBLARD, G
    PANABIERE, JP
    MICROELECTRONIC ENGINEERING, 1991, 13 (1-4) : 173 - 176
  • [48] RESIST PROFILE OPTIMIZATION IN E-BEAM LITHOGRAPHY
    GILLESPIE, SJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (06) : C232 - C232
  • [49] Maskless EUV lithography, an alternative to e-beam
    Johnson, Kenneth C.
    JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2019, 18 (04):
  • [50] Writing strategy for e-beam lithography tools
    Froyen, Eddy
    Coopmans, Fedor
    Microelectronic Engineering, 1989, 9 (1-4) : 239 - 241