Small Firm Survival and Technological Activity

被引:0
|
作者
Rajshree Agarwal
机构
[1] University of Central Florida,Department of Economics
来源
Small Business Economics | 1998年 / 11卷
关键词
High Probability; Rate Function; Empirical Result; Hazard Rate; Small Firm;
D O I
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中图分类号
学科分类号
摘要
The paper investigates the post entry performance of small firms competing under different technological environments. Small firm survival is compared over technical and non-technical products and over stages of differing technological activity. The empirical results, in the context of the product life-cycle framework, show that small firms enjoy a higher probability of survival in stages of high technological activity, and in products that are more technical in nature. Technological activity is also seen to affect the shape of the hazard rate function, implying that the relation between technological activity, age and small firm survival may be complex.
引用
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页码:215 / 224
页数:9
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