Large disparity between gallium and antimony self-diffusion in gallium antimonide

被引:0
|
作者
H. Bracht
S. P. Nicols
W. Walukiewicz
J. P. Silveira
F. Briones
E. E. Haller
机构
[1] University of California and Lawrence Berkeley National Laboratory,
[2] Instituto de Microelectrónica de Madrid,undefined
[3] Centro Nacional de Microelectrónica,undefined
[4] CSIC,undefined
[5] University of Münster,undefined
[6] Institut für Materialphysik,undefined
来源
Nature | 2000年 / 408卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
The most fundamental mass transport process in solids is self-diffusion. The motion of host-lattice (‘self-’) atoms in solids is mediated by point defects such as vacancies or interstitial atoms, whose formation and migration enthalpies determine the kinetics of this thermally activated process1,2. Self-diffusion studies also contribute to the understanding of the diffusion of impurities, and a quantitative understanding of self- and foreign-atom diffusion in semiconductors is central to the development of advanced electronic devices. In the past few years, self-diffusion studies have been performed successfully with isotopically controlled semiconductor heterostructures of germanium3, silicon4, gallium arsenide5,6 and gallium phosphide7. Self-diffusion studies with isotopically controlled GaAs and GaP have been restricted to Ga self-diffusion, as only Ga has two stable isotopes, 69Ga and 71Ga. Here we report self-diffusion studies with an isotopically controlled multilayer structure of crystalline GaSb. Two stable isotopes exist for both Ga and Sb, allowing the simultaneous study of diffusion on both sublattices. Our experiments show that near the melting temperature, Ga diffuses more rapidly than Sb by over three orders of magnitude. This surprisingly large difference in atomic mobility requires a physical explanation going beyond standard diffusion models. Combining our data for Ga and Sb diffusion with related results for foreign-atom diffusion in GaSb (refs 8, 9), we conclude that the unusually slow Sb diffusion in GaSb is a consequence of reactions between defects on the Ga and Sb sublattices, which suppress the defects that are required for Sb diffusion.
引用
收藏
页码:69 / 72
页数:3
相关论文
共 50 条
  • [31] SELF-DIFFUSION AND ANTIMONY DIFFUSION IN TELLURIUM
    WERNER, M
    MEHRER, H
    SIETHOFF, H
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1983, 16 (32): : 6185 - 6195
  • [32] SPECTRAL DETERMINATION OF CONTAMINATIONS IN HIGH-PURITY ANTIMONY AND GALLIUM ANTIMONIDE
    BARANOVA, LL
    NAZAROVA, MG
    SOLODOVNIK, SM
    INDUSTRIAL LABORATORY, 1970, 36 (09): : 1369 - +
  • [33] Electrochemical investigation of formation of gallium antimonide on antimony surface in molten electrolyte
    Morachevskii, AG
    Klebanov, EB
    RUSSIAN JOURNAL OF APPLIED CHEMISTRY, 1996, 69 (02) : 216 - 219
  • [34] SELF-DIFFUSION IN LIQUID ANTIMONY
    LAMPARTER, P
    STEEB, S
    ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1977, 32 (09): : 1021 - 1024
  • [35] MECHANISMS OF DOPING-ENHANCED SUPERLATTICE DISORDERING AND OF GALLIUM SELF-DIFFUSION IN GAAS
    TAN, TY
    GOSELE, U
    APPLIED PHYSICS LETTERS, 1988, 52 (15) : 1240 - 1242
  • [36] EFFECT OF DOPING ON PHONON DIFFUSION IN GALLIUM ANTIMONIDE AT LOW TEMPERATURE
    POUJADE, AM
    ALBANY, HJ
    BOUGNOT, G
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1969, 268 (12): : 860 - &
  • [38] Zinc diffusion into gallium antimonide from polymer spin-on films
    Kamanin, A
    Shmidt, N
    Ber, B
    Ratnikov, V
    Khvostikov, V
    Lantratov, V
    L'vova, T
    Sorokina, S
    Andreev, V
    DIFFUSIONS IN MATERIALS: DIMAT2000, PTS 1 & 2, 2001, 194-1 : 751 - 754
  • [39] SOME RESULTS ON THE DIFFUSION OF IMPURITIES AND THEIR EFFECT ON THE ELECTRICAL PROPERTIES OF GALLIUM ANTIMONIDE
    BOLTAKS, BI
    GUTOROV, YA
    SOVIET PHYSICS-SOLID STATE, 1960, 1 (07): : 930 - 935
  • [40] TEMPERATURE AND CONCENTRATION DEPENDENCES OF DIFFUSION-COEFFICIENT OF ZINC IN GALLIUM ANTIMONIDE
    BLASHKU, AI
    BOLTAKS, BI
    BURDIYAN, II
    RZAEV, MA
    DZHAFAROV, TD
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1972, 6 (03): : 402 - +