The three dimensional domain structure of barium titanate thin films was determined using a serial sectioning technique. The domain structure varied sharply through the film thickness, being primarily a-oriented near the substrate and increasingly c-oriented away from this interface. The variation in domain structure is explained in terms of a strain gradient due to partial relaxation of epitaxial coherency strains. The refractive index also varied through the film thickness. A simple relationship based on areal fraction of each domain type aptly described the changes in refractive index with domain structure. These results indicate the importance of understanding three-dimensional domain structure and its impact on film properties.
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Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R ChinaHong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China
Lu, SG
Zhu, XH
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机构:Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China
Zhu, XH
Mak, CL
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机构:Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China
Mak, CL
Wong, KH
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机构:Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China
Wong, KH
Chan, HLW
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机构:Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China
Chan, HLW
Choy, CL
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机构:Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China