Redistribution of a material at femtosecond laser ablation of a thin silver film

被引：0
|
作者：
P. A. Danilov
D. A. Zayarny
A. A. Ionin
S. I. Kudryashov
A. A. Rudenko
A. A. Kuchmizhak
O. B. Vitrik
Yu. N. Kulchin
V. V. Zhakhovsky
N. A. Inogamov
机构：
[1] Russian Academy of Sciences,Lebedev Physical Institute
[2] National Research Nuclear University MEPhI (Moscow Engineering Physics Institute),Institute for Automation and Control Processes, Far Eastern Branch
[3] Russian Academy of Sciences,Landau Institute for Theoretical Physics
[4] Far Eastern Federal University,undefined
[5] Dukhov Research Institute of Automatics,undefined
[6] Russian Academy of Sciences,undefined
来源：
JETP Letters | 2016年 / 104卷
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摘要：
Energy-dispersive X-ray microspectroscopy is used for the first time to quantitatively study the spatial displacement of the material of a 100-nm silver film irradiated by a single femtosecond laser pulse focused on a small spot in the diffraction limit. The silver mass distribution over radial cross sections is determined and matter balance is analyzed for the resulting radially symmetric submicron structures of a microcone with a nanospike with various heights and a through hole. Hydrodynamic processes and phase transitions inducing the melting of the film, motion of the melt, and its recrystallization within a focal spot are studied.
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页码：759 / 765
页数：6
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