Shape selection of wavelets for accurate chromatic dispersion measurement of white-light spectral interferograms

被引:0
|
作者
Y. Deng
W. Yang
Z. Zhang
机构
[1] National Institute of Metrology,Optics Division
[2] University of Beijing,Institute of Quantum Electronics, State Key Laboratory of Advanced Optical Communication System and Networks, School of Electronics Engineering and Computer Science
[3] University of California Berkeley,Department of Electrical Engineering and Computer Sciences
来源
Applied Physics B | 2010年 / 98卷
关键词
42.65.Re; 07.60.Ly;
D O I
暂无
中图分类号
学科分类号
摘要
The group delay of chirped mirrors can be directly read from the ridge of wavelet-transform of white-light spectral interferograms. In this paper, we investigate the influence of Gabor wavelet shaping factor on the precision of the group-delay dispersion extraction. The rule of selection of shaping factor is given for accurate chromatic dispersion measurement of chirped mirrors.
引用
收藏
页码:347 / 351
页数:4
相关论文
共 50 条
  • [21] CHROMATIC DISPERSION MEASUREMENT BY WHITE-LIGHT INTERFEROMETRY ON METER-LENGTH SINGLE-MODE OPTICAL FIBERS
    SHANG, HT
    ELECTRONICS LETTERS, 1981, 17 (17) : 603 - 605
  • [22] CHROMATIC DISPERSION MEASUREMENT BY WHITE-LIGHT INTERFEROMETRY ON METER-LENGTH SINGLE-MODE OPTICAL FIBER
    SHANG, HT
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1981, 71 (12) : 1587 - 1587
  • [23] ACCURATE MEASUREMENT OF LENS THICKNESS BY USING WHITE-LIGHT FRINGES
    TSURUTA, T
    ICHIHARA, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 : 369 - 372
  • [24] Analysis of white-light interferograms by using Stockwell transform
    Sarac, Zehra
    OPTICS AND LASERS IN ENGINEERING, 2008, 46 (11) : 823 - 828
  • [25] WHITE-LIGHT OPTICAL-PROCESSING OF SPECKLE INTERFEROGRAMS
    YU, FTS
    RUTERBUSCH, PH
    GERHART, GR
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 353 : 90 - 95
  • [26] Spectrally resolved white-light interferometry for measurement of ocular dispersion
    Hammer, DX
    Welch, AJ
    Noojin, GD
    Thomas, RJ
    Stolarski, DJ
    Rockwell, BA
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1999, 16 (09) : 2092 - 2102
  • [27] Shape measurement of a thin glass plate through analyzing dispersion effects in a white-light scanning interferometer
    Luo, Songjie
    Sasaki, Osami
    Choi, Samuel
    Suzuki, Takamasa
    Chen, Ziyang
    Pu, Jixiong
    OPTICS AND LASERS IN ENGINEERING, 2021, 139
  • [28] White-light spectral interferometry used for dispersion characterization of optical fibers
    Hlubina, P
    Martynkien, T
    Urbanczyk, W
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION III, 2003, 5144 : 787 - 795
  • [29] Dispersion error of a beam splitter cube in white-light spectral interferometry
    Hlubina, P.
    Lunacek, J.
    Ciprian, D.
    Chlebus, R.
    OPTO-ELECTRONICS REVIEW, 2008, 16 (04) : 439 - 443
  • [30] Nanodisplacement measurement using spectral shifts in a white-light interferometer
    Brundavanam, Maruthi M.
    Viswanathan, Nirmal K.
    Rao, D. Narayana
    APPLIED OPTICS, 2008, 47 (34) : 6334 - 6339