Electrical breakdown and high-energy electron emission under dielectric charging

被引：0
|
作者：
V. S. Kortov
S. V. Zvonarev
机构：
[1] Ural State Technical University,
来源：
Russian Physics Journal | 2008年 / 51卷
关键词：
Electric Field Strength; Optical Phonon; Impact Ionization; Acoustic Phonon; Electrical Breakdown;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A Monte-Carlo calculation model for electron transport in crystalline dielectrics charged by irradiation is improved with allowance for impact ionization and cascading processes. The electron transport in SiO2 is simulated for high-strength electric fields. It is found that a breakdown in a dielectric can occur in the electric field strength range 11.5–12.5 MV/cm.
引用
收藏
页码：277 / 284
页数：7
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