All-Silicon Ultra-Broadband Infrared Light Absorbers

被引:0
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作者
Kazim Gorgulu
Abdullah Gok
Mehmet Yilmaz
Kagan Topalli
Necmi Bıyıklı
Ali K. Okyay
机构
[1] Bilkent University,Department of Electrical and Electronics Engineering
[2] UNAM-National Nanotechnology Research Center,undefined
[3] Bilkent University,undefined
[4] Institute of Materials Science and Nanotechnology,undefined
[5] Bilkent University,undefined
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Scientific Reports | / 6卷
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摘要
Absorbing infrared radiation efficiently is important for critical applications such as thermal imaging and infrared spectroscopy. Common infrared absorbing materials are not standard in Si VLSI technology. We demonstrate ultra-broadband mid-infrared absorbers based purely on silicon. Broadband absorption is achieved by the combined effects of free carrier absorption, and vibrational and plasmonic absorption resonances. The absorbers, consisting of periodically arranged silicon gratings, can be fabricated using standard optical lithography and deep reactive ion etching techniques, allowing for cost-effective and wafer-scale fabrication of micro-structures. Absorption wavebands in excess of 15 micrometers (5–20 μm) are demonstrated with more than 90% average absorptivity. The structures also exhibit broadband absorption performance even at large angles of incidence (θ = 50°), and independent of polarization.
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