Non-destructive elemental depth-profiling with muonic X-rays

被引：0
|
作者：
M. K. Kubo
H. Moriyama
Y. Tsuruoka
S. Sakamoto
E. Koseto
T. Saito
K. Nishiyama
机构：
[1] International Christian University,
[2] Japan Atomic Energy Agency,undefined
[3] National Museum of Japanese History,undefined
[4] High Energy Accelerator Research Organization,undefined
来源：
Journal of Radioanalytical and Nuclear Chemistry | 2008年 / 278卷
关键词：
Cadmium Zinc Telluride; Muonic Atom; Elemental Analysis Method; Muon Beam; Zinc Telluride;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
An elemental analysis method using muonic X-rays has been developed. Applying the unique features of the negative muon, this method enables elemental distribution in an object to be obtained three dimensionally and non-destructively. Especially, by choosing the incident muon beam energy, depth-profiling as deep as several cm from the surface can be achieved by detecting the high energy muonic X-rays carrying the information of the atom which captured the muon. We obtained some preliminary results and showed the applicability of the technique in future analytical facilities.
引用
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页码：777 / 781
页数：4
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