Fabrication of uniform 4H-SiC mesopores by pulsed electrochemical etching

被引:0
|
作者
Jia-Hui Tan
Zhi-zhan Chen
Wu-Yue Lu
Yue Cheng
Hong He
Yi-Hong Liu
Yu-Jun Sun
Gao-Jie Zhao
机构
[1] Shanghai Normal University,Department of Physics
关键词
Constant pulsed current; Uniform mesopores; Cycle time; Pause time;
D O I
暂无
中图分类号
学科分类号
摘要
In this letter, the uniform 4H silicon carbide (SiC) mesopores was fabricated by pulsed electrochemical etching method. The length of the mesopores is about 19 μm with a diameter of about 19 nm. The introduction of pause time (Toff) is crucial to form the uniform 4H-SiC mesopores. The pore diameter will not change if etching goes with Toff. The hole concentration decreasing at the pore tips during the Toff is the main reason for uniformity.
引用
收藏
相关论文
共 50 条
  • [1] Fabrication of uniform 4H-SiC mesopores by pulsed electrochemical etching
    Tan, Jia-Hui
    Chen, Zhi-zhan
    Lu, Wu-Yue
    Cheng, Yue
    He, Hong
    Liu, Yi-Hong
    Sun, Yu-Jun
    Zhao, Gao-Jie
    NANOSCALE RESEARCH LETTERS, 2014, 9
  • [2] Graphene-assistingPhoto-electrochemical Etching of 4H-SiC
    Sun, Li
    Chen, Xiufang
    Zhang, Fusheng
    Yu, Cancan
    Zhao, Xian
    Xu, Xiangang
    Zhang, Yong
    Wang, Ruiqi
    2016 13TH CHINA INTERNATIONAL FORUM ON SOLID STATE LIGHTING: INTERNATIONAL FORUM ON WIDE BANDGAP SEMICONDUCTORS CHINA (SSLCHINA: IFWS), 2016, : 27 - 30
  • [3] Electrochemical etching modes of 4H-SiC in KOH solutions
    Yang, Shangyu
    Zhao, Siqi
    Chen, Junhong
    Li, Yunkai
    Yan, Guoguo
    Guan, Min
    Zhang, Yang
    Sun, Guosheng
    Zeng, Yiping
    Liu, Xingfang
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2023, 38 (05)
  • [4] Optical properties of mesoporous 4H-SiC prepared by anodic electrochemical etching
    Rashid, Marzaini
    Horrocks, B. R.
    Healy, N.
    Goss, J. P.
    Horsfall, A. B.
    JOURNAL OF APPLIED PHYSICS, 2016, 120 (19)
  • [5] Characterization and reuse of SiC flakes generated during electrochemical etching of 4H-SiC wafers
    Barcellona, Matteo
    Spano, Vanessa
    Fiorenza, Roberto
    Scire, Salvatore
    Defforge, Thomas
    Gautier, Gael
    Fragala, Maria Elena
    JOURNAL OF MATERIALS CHEMISTRY A, 2025, 13 (04) : 3034 - 3044
  • [6] ICP etching of 4H-SiC substrates
    Biscarrat, Jerome
    Michaud, Jean-Francois
    Collard, Emmanuel
    Alquier, Daniel
    SILICON CARBIDE AND RELATED MATERIALS 2012, 2013, 740-742 : 825 - +
  • [7] Fabrication and characterization of 4H-SiC MESFETs
    Ning, Jin
    Zhang, Yang
    Liu, Zhongli
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2007, 28 (SUPPL.): : 385 - 387
  • [8] Fabrication and characterization of CuAlO2/4H-SiC heterostructure on 4H-SiC (0001)
    Hu, Jichao
    Li, Dan
    He, Xiaomin
    Wang, Xi
    Xu, Bei
    Zang, Yuan
    Li, Lianbi
    SUPERLATTICES AND MICROSTRUCTURES, 2021, 155
  • [9] Mass fabrication of 4H-SiC high temperature pressure sensors by femtosecond laser etching
    Wang, Lukang
    Zhao, You
    Zhao, Yulong
    Yang, Yu
    Li, Bo
    Gong, Taobo
    2021 IEEE 16TH INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS (NEMS), 2021, : 1478 - 1481
  • [10] Localized anodization of 4H-SiC by electrochemical etching with constant current mode in KOH solutions
    Zhao, Siqi
    Yang, Shangyu
    Li, Yunkai
    Yan, Guoguo
    Zhao, Wanshun
    Wang, Lei
    Sun, Guosheng
    Zeng, Yiping
    Liu, Xingfang
    MICRO AND NANOSTRUCTURES, 2023, 183