High-Energy Synchrotron X-Ray Diffraction for In Situ Diffuse Scattering Studies of Bulk Single Crystals

被引：0
|
作者：
John E. Daniels
Wook Jo
Wolfgang Donner
机构：
[1] University of New South Wales,School of Materials Science and Engineering
[2] Technische Universität Darmstadt,Institute of Materials Science
来源：
JOM | 2012年 / 64卷
关键词：
Bragg Peak; Reciprocal Space; Diffuse Scattering; Superlattice Reflection; Dielectric Breakdown Strength;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
High-energy synchrotron x-ray scattering offers a powerful technique for investigation of single-crystal material structures. Large, mm-sized crystals can be used, allowing complex in situ sample environments to be employed. Here, we demonstrate how this technique can be applied for the collection of single-crystal diffuse scattering volumes from the electro-active material 96%Bi0.5Na0.5TiO3-4%BaTiO3 while electric fields are applied in situ. The data obtained allow correlation of the atomic and nanoscale structures with the observed macroscopic electro-active properties of interest. This article presents a recent study relating the nanoscale stacking fault structure in BNT-BT to the relaxor-ferroelectric nature of the material [Daniels et al. in Appl. Phys. Lett. 98, 252904 (2011)], and extends this study with further experimental description and analysis.
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页码：174 / 180
页数：6
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