Dependence of the transversal magneto-optic Kerr effect on the incidence angle of light for ultrathin films of cobalt and Co/Cu/Co multilayers

被引：0
|
作者：
Naumov V.V. [1 ]
Paporkov V.A. [2 ]
Lokhankin M.V. [2 ]
机构：
[1] Yaroslavl Branch, Physicotechnological Institute, Russian Academy of Sciences, Yaroslavl 150007
[2] Yaroslavl State University, Yaroslavl 150000
来源：
Russian Microelectronics | 2009年 / 38卷 / 4期
关键词：
PACS:; 68.37.-d;
D O I：
10.1134/S1063739709040039
中图分类号：
学科分类号：
摘要：
The transversal magneto-optic Kerr effect in thin cobalt films and Co/Cu/Co structures obtained by magnetron sputtering in the magnetic field is investigated. It is shown that the dependences of the TMOKE and reflection intensity on the incidence angle of light substantially vary upon varying the thickness of the cobalt layer from 6 to 0.7 nm. The theoretical evaluation of the obtained data in the context of the classic theory of propagation of light in the conducting medium is presented © 2009 Pleiades Publishing, Ltd.
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页码：251 / 256
页数：5
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