Van der Waals device integration beyond the limits of van der Waals forces using adhesive matrix transfer

被引:0
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作者
Peter F. Satterthwaite
Weikun Zhu
Patricia Jastrzebska-Perfect
Melbourne Tang
Sarah O. Spector
Hongze Gao
Hikari Kitadai
Ang-Yu Lu
Qishuo Tan
Shin-Yi Tang
Yu-Lun Chueh
Chia-Nung Kuo
Chin Shan Lue
Jing Kong
Xi Ling
Farnaz Niroui
机构
[1] Massachusetts Institute of Technology,Department of Electrical Engineering and Computer Science
[2] Massachusetts Institute of Technology,Research Laboratory of Electronics
[3] Massachusetts Institute of Technology,Department of Chemical Engineering
[4] Massachusetts Institute of Technology,Department of Physics
[5] Boston University,Department of Chemistry
[6] National Tsing Hua University,Department of Materials Science and Engineering
[7] Hon Hai Research Institute,Semiconductor Research Center
[8] National Tsing Hua University,College of Semiconductor Research
[9] National Cheng Kung University,Department of Physics
[10] National Science and Technology Council,Taiwan Consortium of Emergent Crystalline Materials
[11] National Cheng Kung University,Program on Key Materials, Academy of Innovative Semiconductor and Sustainable Manufacturing
[12] Boston University,Division of Materials Science and Engineering
[13] Boston University,The Photonics Center
来源
Nature Electronics | 2024年 / 7卷
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摘要
Pristine van der Waals (vdW) heterostructures formed between two-dimensional (2D) and other materials can be used to create optical and electronic devices. However, the weak vdW forces alone do not allow direct physical stacking of arbitrary layers. As a result, vdW heterostructure fabrication typically requires solvents, sacrificial layers or high temperatures, which can introduce damage and contaminants. Here, we show that adhesive matrix transfer can eliminate these limitations and can provide vdW integration beyond the limits of vdW forces. In the approach, a hybrid high- and low-adhesion surface is used to decouple the forces driving the transfer from the vdW forces defining the heterostructure of interest. We show that the technique can be used to achieve direct vdW integration of diverse 2D materials (MoS2, WSe2, PtS2 and GaS) with dielectrics (SiO2 and Al2O3), which is conventionally forbidden but critical for active devices and scalable, aligned heterostructure formation. The approach also allows single-step 2D material-to-device integration, which we illustrate by fabricating arrays of monolayer MoS2 transistors. As any exposure to solvents or polymers is avoided, the interfaces and surfaces remain pristine. Thus, intrinsic 2D material properties can be probed without the influence of processing steps. The materials can be further engineered through surface treatments and used to fabricate unconventional device form factors.
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页码:17 / 28
页数:11
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