Physical and chemical imaging of adhesive interfaces with soft X-rays

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作者
Hiroyuki Yamane
Masaki Oura
Osamu Takahashi
Tomoko Ishihara
Noriko Yamazaki
Koichi Hasegawa
Tetsuya Ishikawa
Kiyoka Takagi
Takaki Hatsui
机构
[1] RIKEN SPring-8 Center,Basic Chemistry Program, Graduate School of Advanced Science and Engineering
[2] RIKEN,undefined
[3] Hiroshima University,undefined
[4] Chemical Research Department,undefined
[5] Research & Innovation Center,undefined
[6] Mitsubishi Heavy Industries,undefined
[7] Ltd.,undefined
[8] Manufacturing Technology Research Department,undefined
[9] Research & Innovation Center,undefined
[10] Mitsubishi Heavy Industries,undefined
[11] Ltd.,undefined
[12] Fixed Wing Aircraft Engineering Department,undefined
[13] Integrated Defense & Space Systems,undefined
[14] Mitsubishi Heavy Industries,undefined
[15] Ltd.,undefined
[16] Photon Science Innovation Center,undefined
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摘要
Adhesion is an interfacial phenomenon that is critical for assembling carbon structural composites for next-generation aircraft and automobiles. However, there is limited understanding of adhesion on the molecular level because of the difficulty in revealing the individual bonding factors. Here, using soft X-ray spectromicroscopy we show the physical and chemical states of an adhesive interface composed of a thermosetting polymer of 4,4’-diaminodiphenylsulfone-cured bisphenol A diglycidyl ether adhered to a thermoplastic polymer of plasma-treated polyetheretherketone. We observe multiscale phenomena in the adhesion mechanisms, including sub-mm complex interface structure, sub-μm distribution of the functional groups, and molecular-level covalent-bond formation. These results provide a benchmark for further research to examine how physical and chemical states correlate with adhesion, and demonstrate that soft X-ray imaging is a promising approach for visualizing the physical and chemical states at adhesive interfaces from the sub-mm level to the molecular level.
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