XAFS spectroscopy; fundamental principles and data analysis

被引：0
|
作者：
D.C. Koningsberger
B.L. Mojet
G.E. van Dorssen
D.E. Ramaker
机构：
[1] Debye Institute,Department of Inorganic Chemistry and Catalysis
[2] Utrecht University,Department of Chemistry and Materials Science Institute
[3] George Washington University,undefined
来源：
Topics in Catalysis | 2000年 / 10卷
关键词：
XAFS physical principles; XAFS data analysis; fitting in ; -space; detection of low ; scatterers; phase- and amplitude; -corrected Fourier transforms; difference file technique; use of theoretical references;
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摘要：
The physical principles of XAFS spectroscopy are given at a sufficiently basic level to enable scientists working in the field of catalysis to critically evaluate articles dealing with XAFS studies on catalytic materials. The described data-analysis methods provide the basic tools for studying the electronic and structural properties of supported metal, metal–oxide or metal–sulfide catalysts. These methods include (a) fitting in R-space, (b) application of the difference file technique and (c) control of the fit procedure with k1 and k3 weighting with the help of phase- and amplitude-corrected Fourier transforms.
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页码：143 / 155
页数：12
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