Spectroscopic analysis and thermoelectric properties of ITO/Cu/Ni/ITO multilayer by RF sputtering

被引：1

作者：

Tchenka, Abdelaziz ^{[1
]}

Agdad, Abdelali ^{[1
]}

Amiri, Lahoucine ^{[1
]}

Bousseta, Mohammed ^{[1
]}

El Mouncharih, Abdelkarim ^{[1
]}

Elmassi, Said ^{[1
]}

Nkhaili, Lahcen ^{[1
]}

Ech-Chamikh, Elmaati ^{[1
]}

机构：

[1] Cadi Ayyad Univ, Fac Sci Semlalia, Phys Dept, Lab Mat Energy & Environm LaMEE, POB 2390, Marrakech 40000, Morocco

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2024年 / 130卷 / 05期

关键词：

ITO/Cu/Ni/ITO; Multilayer; Optical properties; Electrical properties; Thermoelectric properties; TRANSPARENT CONDUCTIVE ITO; THIN-FILMS; ELECTRICAL-PROPERTIES; SUBSTRATE; THICKNESS; POWER; TEMPERATURE; PRESSURE;

D O I：

10.1007/s00339-024-07457-z

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, we present the effects of annealing in a vacuum on the structural, electrical, thermoelectric, optical and properties of a glass/ITO (40 nm)/Cu (5 nm)/Ni (10 nm)/ITO (40 nm) multilayer prepared on glass substrates at room temperature using the Radio Frequency (RF) sputtering technique. The effect of annealing in a vacuum is investigated. The structures of the ICNI were analyzed using X-Ray Reflectivity (XRR) and X-Ray Diffraction (XRD). Furthermore, the electrical and optical properties were characterized using the four-point probe measurement method and a UV-Vis-NIR spectrometer, respectively. The influence of the annealing temperature in a vacuum on transmittance, structural integrity, electrical behavior, energy band gap, resistivity, Seebeck coefficient, and figure of merit were investigated.

引用

页数：8

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