Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture

被引:0
|
作者
Jari Hannu
Teuvo Saikkonen
Juha Häkkinen
Juha Karttunen
Markku Moilanen
机构
[1] University of Oulu,Microelectronics and Materials Physics Laboratories
[2] University of Oulu,Optoelectronics and Measurement Techniques Laboratory
[3] University of Oulu,Electronics Laboratory
来源
关键词
Remote testing; Embedded testing; Test control; Mixed-signals;
D O I
暂无
中图分类号
学科分类号
摘要
Remote testing requires embedded test infrastructure, consisting of communication, test control and test access. This article presents an embedded test solution for a low-frequency audio board. Supporting analog testing, the solution consists of a measurement and calculation method for passive component characterization, analog test bus solution and an embedded test controller for controlling embedded tests and providing test stimuli. Moreover, the solution, which supports the presented test plan, was compared to a test plan supporting traditional testing. It was found that the embedded test solution provided a 29% test coverage of the audio board components and substituted flying probe testing included in the traditional test plan. Besides such benefits as improved fault diagnostics and lower manufacturing costs, the paper also discusses the drawbacks of the presented solution, including reduced measurement accuracy. This paper also presents a correction to a previously presented passive component measurement and calculation method.
引用
收藏
页码:641 / 658
页数:17
相关论文
共 50 条
  • [41] Integrated design and test of mixed-signal circuits
    Engin, Nur
    Kerkhoff, Hans G.
    Tangelder, Ronald J. W. T.
    Speek, Han
    Journal of Electronic Testing: Theory and Applications (JETTA), 1999, 14 (01): : 75 - 83
  • [42] A uniform approach to mixed-signal circuit test
    Lin, F
    Lin, ZH
    Lin, TW
    INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 1997, 25 (02) : 81 - 93
  • [43] Analogue and mixed-signal test for systems on chip
    Sun, YC
    IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, 2004, 151 (04): : 335 - 336
  • [44] Adaptive Test Flow for Mixed-Signal ICs
    Stratigopoulos, Haralampos-G.
    Streitwieser, Christian
    2017 IEEE 35TH VLSI TEST SYMPOSIUM (VTS), 2017,
  • [45] Design for test of mixed-signal integrated circuits
    Kac, Uros
    INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2006, 36 (02): : 71 - 78
  • [46] Educational development for mixed-signal design and test
    Newman, KE
    Edelstein, G
    53RD ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2003 PROCEEDINGS, 2003, : 767 - 769
  • [47] Challenges for mixed-signal board design and test
    Roberts, G
    20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2002, : 317 - 317
  • [48] Integrated design and test of mixed-signal circuits
    Engin, N
    Kerkhoff, HG
    Tangelder, RJWT
    Speek, H
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1999, 14 (1-2): : 75 - 83
  • [49] The test search for true mixed-signal cores
    Kerkhoff, HG
    MICROELECTRONICS JOURNAL, 2005, 36 (12) : 1103 - 1111
  • [50] Built-in self-test streamlines testing of mixed-signal SoCs
    Turino, J.
    2001, Penton Publishing Co. (49)