Reliability of manufacturing equipment in complex environments

被引：1

作者：

Jeffrey P. Kharoufeh

Steven M. Cox

Mark E. Oxley

机构：

[1] University of Pittsburgh,Department of Industrial Engineering

[2] CAPE/RA/WSCAD,Office of the Secretary of Defense

[3] Air Force Institute of Technology,Department of Mathematics and Statistics

来源：

Annals of Operations Research | 2013年 / 209卷

关键词：

Sojourn Time; Random Environment; Lifetime Distribution; Functional Central Limit Theorem; Sojourn Time Distribution;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We present two stochastic failure models for the reliability evaluation of manufacturing equipment that degrades due to its complex operating environment. The first model examines the case when the environment is a temporally nonhomogeneous continuous-time Markov chain, and the second assumes the environment is a temporally homogeneous semi-Markov process on a finite space. Derived are transform expressions for the lifetime distributions. A few examples are provided to illustrate the main results.

引用

页码：231 / 254

页数：23

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