Reliability of manufacturing equipment in complex environments

被引：1
|
作者：
Jeffrey P. Kharoufeh
Steven M. Cox
Mark E. Oxley
机构：
[1] University of Pittsburgh,Department of Industrial Engineering
[2] CAPE/RA/WSCAD,Office of the Secretary of Defense
[3] Air Force Institute of Technology,Department of Mathematics and Statistics
来源：
Annals of Operations Research | 2013年 / 209卷
关键词：
Sojourn Time; Random Environment; Lifetime Distribution; Functional Central Limit Theorem; Sojourn Time Distribution;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We present two stochastic failure models for the reliability evaluation of manufacturing equipment that degrades due to its complex operating environment. The first model examines the case when the environment is a temporally nonhomogeneous continuous-time Markov chain, and the second assumes the environment is a temporally homogeneous semi-Markov process on a finite space. Derived are transform expressions for the lifetime distributions. A few examples are provided to illustrate the main results.
引用
收藏
页码：231 / 254
页数：23
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