Analysis of the structure and deformation of a woven composite lamina using X-ray microdiffraction

被引:0
|
作者
Richard J. Davies
Stephen J. Eichhorn
James A. Bennett
Christian Riekel
Robert J. Young
机构
[1] European Synchrotron Radiation Facility,Materials Science Centre, School of Materials
[2] University of Manchester,undefined
来源
关键词
Detector Plane; Macroscopic Strain; Electronic Speckle Pattern Interferometry; Multiphase Material; Resistance Strain Gauge;
D O I
暂无
中图分类号
学科分类号
摘要
X-ray diffraction (XRD) is an important tool for studying multiphase materials because it can resolve parameters from each phase independently. When coupled with a high-flux, microfocussed X-ray beam, scanning microdiffraction experiments are possible. This technique can investigate how reciprocal-space parameters vary as a function of real-space sample geometry for heterogeneous materials. Consequently, multiphase materials can be imaged in terms of those parameter variations. This study reports on the use of microfocussed X-ray diffraction (μXRD) to both image and follow the deformation of a multiphase material. In this case, this technique is applied to the study of a woven fibre-reinforced composite (FRC) lamina. Such systems are difficult to study with other experimental techniques because the fibres are inaccessible and the matrix is often opaque. However, using μXRD it is possible to assess both sample geometry and stress field information simultaneously.
引用
收藏
页码:6724 / 6733
页数:9
相关论文
共 50 条
  • [21] X-ray microdiffraction studies to measure strain fields in a metal matrix composite
    Lee, HR
    Kupperman, D
    Yun, W
    Cai, Z
    Rodrigues, W
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (01): : 175 - 177
  • [22] INVESTIGATION OF STRUCTURE OF FE-MN ALLOYS BY X-RAY MICRODIFFRACTION
    BOGACHEV, IN
    EGOLAEV, VF
    CHUMAKOV.LD
    SHKLYAR, RS
    STEEL IN THE USSR, 1973, 3 (08): : 679 - 682
  • [23] The fractal dimension of X-ray tomographic sections of a woven composite
    Summerscales, J
    Russell, PM
    Lomov, S
    Verpoest, I
    Parnas, RS
    ADVANCED COMPOSITES LETTERS, 2004, 13 (02) : 113 - 121
  • [24] Histological structure of human nail as studied by synchrotron X-ray microdiffraction
    Garson, JC
    Baltenneck, F
    Leroy, F
    Riekel, C
    Müller, M
    CELLULAR AND MOLECULAR BIOLOGY, 2000, 46 (06) : 1025 - 1034
  • [25] Deformation twinning and residual stress in calcite studied with synchrotron polychromatic X-ray microdiffraction
    Chen, Kai
    Kunz, Martin
    Tamura, Nobumichi
    Wenk, Hans-Rudolf
    PHYSICS AND CHEMISTRY OF MINERALS, 2011, 38 (06) : 491 - 500
  • [26] Deformation twinning and residual stress in calcite studied with synchrotron polychromatic X-ray microdiffraction
    Kai Chen
    Martin Kunz
    Nobumichi Tamura
    Hans-Rudolf Wenk
    Physics and Chemistry of Minerals, 2011, 38 : 491 - 500
  • [27] X-ray microdiffraction imaging of a silicon microcantilever
    Hassani, Kh.
    Sutton, M.
    Tkachuk, A.
    Holt, M.
    JOURNAL OF APPLIED PHYSICS, 2007, 101 (06)
  • [28] Applications of X-ray microdiffraction in the imaging industry
    Blanton, Thomas N.
    POWDER DIFFRACTION, 2006, 21 (02) : 91 - 96
  • [29] HARD X-RAY MICRODIFFRACTION ON SOFT MATERIALS
    Riekel, C.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C33 - C33
  • [30] Simultaneous microRaman spectroscopy and X-ray microdiffraction
    Davies, Richard J.
    Burghammer, Manfred
    Riekel, Christian
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2007, 63 : S63 - S63