Review of near-field optical microscopy

被引：0
|
作者：
Wu S.-F. [1 ]
机构：
[1] Institute of Near-field Optics and Nanotechnology, Department of Physics, Dalian University of Technology
来源：
Frontiers of Physics in China | 2006年 / 1卷 / 3期
关键词：
Atomic force microscope combined with photon scanning tunneling optical microscope (AF/PSTM); Near-field optical microscope (NOM); SNOM;
D O I：
10.1007/s11467-006-0027-7
中图分类号：
学科分类号：
摘要：
This review has introduced a new near-field optical microscope (NOM) -atomic force microscope combined with photon scanning tunneling microscope (AF / PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM. © Higher Education Press and Springer-Verlag 2006.
引用
收藏
页码：263 / 274
页数：11
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