A push-pull double-contact MEMS relay fabricated by MetalMUMPs process

被引:0
|
作者
Lifeng Wang
Yue Jin
机构
[1] Southeast University,Key Laboratory of MEMS of the Ministry of Education
来源
Microsystem Technologies | 2017年 / 23卷
关键词
Contact Resistance; Actuation Voltage; Automatic Test Equipment; Moveable Beam; Stress Voltage;
D O I
暂无
中图分类号
学科分类号
摘要
This document presents a push-pull double-contact MEMS (Micro ElectroMechanical System) relay. The MEMS relay is electrostatic driven and laterally actuating. Two push-pull structures form two parallel contacts for the proposed MEMS relay, which can make the contact resistance of the MEMS relay be smaller. The push and pull actions of the push-pull actuators can be accomplished simultaneously using only one action signal. In addition, high inductance DC bias line and substrate removal are used for additional electrical and/or thermal isolation. The fabrication of the proposed switch is based on the standard MetalMUMPs process. The measured pull-in voltage is 116 V and the switch-ON delay is 44 μs. Contact resistance of the MEMS relay is less than 1 Ω when the stress voltage exceeds 120 V.
引用
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页码:2257 / 2262
页数:5
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