Bipolar Resistive Switching Characteristics and Nonvolatile Flash Memory Behavior in Polyvinylcarbazole Films

被引:0
|
作者
Enming Zhao
Xiaodan Liu
Guangyu Liu
Bao Zhou
机构
[1] Dali University,School of Engineering
来源
关键词
PVK; memory effects; nonvolatile; resistive switching;
D O I
暂无
中图分类号
学科分类号
摘要
A nonvolatile resistive switching memory device based on active layers of polyvinylcarbazole (PVK) was fabricated by a spin-coating technique, and the electrical characteristics of the devices consisting of SnO2 doped with fluorine (FTO)/PVK/Ag were investigated. The experimental results revealed that the FTO/PVK/Ag device has electrical bistable nonvolatile flash memory behavior. The current remained stable for 2.3 × 103 s in both the ON state and OFF state, and the current in the ON and OFF states of the FTO/PVK/Ag device did not change substantially after 750 pulse read cycles. In addition, based on the electrochemical properties of the PVK, its resistive switching behavior was investigated. This work provides a promising solution for the development of polymer memory devices.
引用
收藏
页码:1801 / 1807
页数:6
相关论文
共 50 条
  • [31] Thickness dependence of the resistive switching behavior of nonvolatile memory device structures based on undoped ZnO films
    Kang, Youn Hee
    Choi, Ji-Hyuk
    Lee, Tae Il
    Lee, Woong
    Myoung, Jae-Min
    SOLID STATE COMMUNICATIONS, 2011, 151 (23) : 1739 - 1742
  • [32] Unipolar resistive switching behavior in Dy2O3 films for nonvolatile memory applications
    Her, Jim-Long
    Pan, Tung-Ming
    Lu, Chih-Hung
    THIN SOLID FILMS, 2012, 520 (17) : 5706 - 5709
  • [33] Resistive switching characteristics of sol-gel derived ZrCeOx thin films for nonvolatile memory applications
    Wu, You-Shen
    Tsai, Meng-Hung
    Huang, Cheng-Liang
    MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 2022, 277
  • [34] Resistive switching characteristics of Sm2O3 thin films for nonvolatile memory applications
    Huang, Sheng-Yao
    Chang, Ting-Chang
    Chen, Min-Chen
    Chen, Shih-Ching
    Lo, Hung-Ping
    Huang, Hui-Chun
    Gan, Der-Shin
    Sze, Simon M.
    Tsai, Ming-Jinn
    SOLID-STATE ELECTRONICS, 2011, 63 (01) : 189 - 191
  • [35] Characteristics of the bipolar resistive switching behavior in memory device with Au/ZnO/ITO structure
    Wang, Hongjun
    Zhu, Yuanyuan
    Liu, Yong
    CHINESE JOURNAL OF PHYSICS, 2018, 56 (06) : 3073 - 3077
  • [36] Switching characteristic of fabricated nonvolatile bipolar resistive switching memory (ReRAM) using PEDOT: PSS/GO
    Moazzeni, Alireza
    Hamedi, Samaneh
    Kordrostami, Zoheir
    SOLID-STATE ELECTRONICS, 2022, 188
  • [37] Switching characteristic of fabricated nonvolatile bipolar resistive switching memory (ReRAM) using PEDOT: PSS/GO
    Moazzeni, Alireza
    hamedi, Samaneh
    Kordrostami, Zoheir
    Solid-State Electronics, 2022, 188
  • [38] Thickness effect on the bipolar switching mechanism for nonvolatile resistive memory devices based on CeO2 thin films
    Rana, Anwar Manzoor
    Ismail, M.
    Ahmed, E.
    Talib, I.
    Khan, Tahira
    Hussain, M.
    Nadeem, M. Y.
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2015, 39 : 211 - 216
  • [39] Nonvolatile resistive memory switching in amorphous LaGdO3 thin films
    Misra, P.
    Pavunny, S.P.
    Katiyar, R.S.
    Journal of Mechanics, 2013, 1562 (03)
  • [40] Nonvolatile resistive switching memory behavior in WOx/BiFeOy heterojunction based memristor
    Wang, Jiangqiu
    Sun, Bai
    Zhou, Guangdong
    Zhu, Shouhui
    Yang, Chuan
    Ke, Chuan
    Zhao, Yong
    Wang, Hongyan
    JOURNAL OF ALLOYS AND COMPOUNDS, 2023, 939