A sensitive technique for the determination of trace Cu(II) in various samples after column preconcentration by adsorbing onto pulverized Amberlite XAD-4 loaded with N-benzoylphenylhydroxylamine (BPHA) was developed. Several experimental conditions, such as the size of XAD-4, adsorption flow rate, pH of sample solution, and so forth, were optimized. The interfering effects of diverse concomitant ions were investigated. Al(III), Fe(III), Ni(II), and Co(II) interfered, but the interference by these ions was completely eliminated by adjusting the amount of XAD-4-BPHA resin to 0.30 g. The dynamic range, the correlation coefficient (R2), and the detection limit obtained by the proposed technique were 1.0–60, 0.9953, and 0.83 ng/mL, respectively. For validating the technique, the aqueous samples (stream water, reservoir water, and wastewater), the diluted brass sample, and the plastic sample were used as real samples. Recovery yields of 94–102% were obtained. These measured data were not different from ICP-MS data at the 95% confidence level. This method was also validated by rice flour CRM (normal, fortified) samples. Based on the results of the experiment, it has been found that the proposed technique can be applied to the determination of Cu(II) in various real samples.