DeepXplore: Automated Whitebox Testing of Deep Learning Systems

被引:61
|
作者
Pei, Kexin [1 ]
Cao, Yinzhi [2 ]
Yang, Junfeng [1 ]
Jana, Suman [1 ]
机构
[1] Columbia Univ, New York, NY 10027 USA
[2] Johns Hopkins Univ, Baltimore, MD 21218 USA
关键词
Gradient-based search - Joint optimization - Malware detection - Manual checking - Safety and securities - Self drivings - State of the art - White-box testing;
D O I
10.1145/3361566
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Deep learning (DL) systems are increasingly deployed in safety- and security-critical domains such as self-driving cars and malware detection, where the correctness and predictability of a system's behavior for corner case inputs are of great importance. Existing DL testing depends heavily on manually labeled data and therefore often fails to expose erroneous behaviors for rare inputs. We design, implement, and evaluate DeepXplore, the first white-box framework for systematically testing real-world DL systems. First, we introduce neuron coverage for measuring the parts of a DL system exercised by test inputs. Next, we leverage multiple DL systems with similar functionality as cross-referencing oracles to avoid manual checking. Finally, we demonstrate how finding inputs for DL systems that both trigger many differential behaviors and achieve high neuron coverage can be represented as a joint optimization problem and solved efficiently using gradient-based search techniques. DeepXplore efficiently finds thousands of incorrect corner case behaviors (e.g., self-driving cars crashing into guard rails and malware masquerading as benign software) in state-of-the-art DL models with thousands of neurons trained on five popular datasets such as ImageNet and Udacity self-driving challenge data. For all tested DL models, on average, DeepXplore generated one test input demonstrating incorrect behavior within one second while running only on a commodity laptop. We further show that the test inputs generated by DeepXplore can also be used to retrain the corresponding DL model to improve the model's accuracy by up to 3%.
引用
收藏
页码:137 / 145
页数:9
相关论文
共 50 条
  • [21] ARTDL: Adaptive Random Testing for Deep Learning Systems
    Yan, Min
    Wang, Li
    Fei, Aiguo
    IEEE ACCESS, 2020, 8 : 3055 - 3064
  • [22] DeepWeak: Weak Mutation Testing for Deep Learning Systems
    Xue, Yinjie
    Zhang, Zhiyi
    Liu, Chen
    Chen, Shuxian
    Huang, Zhiqiu
    2024 IEEE 24TH INTERNATIONAL CONFERENCE ON SOFTWARE QUALITY, RELIABILITY AND SECURITY, QRS, 2024, : 49 - 60
  • [23] DeepCT: Tomographic Combinatorial Testing for Deep Learning Systems
    Ma, Lei
    Juefei-Xu, Felix
    Xue, Minhui
    Li, Bo
    Li, Li
    Liu, Yang
    Zhao, Jianjun
    2019 IEEE 26TH INTERNATIONAL CONFERENCE ON SOFTWARE ANALYSIS, EVOLUTION AND REENGINEERING (SANER), 2019, : 614 - 618
  • [24] Automated Testing of Systems of Systems
    Akat, Ozge
    Sozer, Hasan
    TESTING SOFTWARE AND SYSTEMS, ICTSS 2023, 2023, 14131 : 73 - 79
  • [25] Testing of Automated Systems
    Mondello, Marina
    Dhawan, Anil
    Keller, Erich
    2014 IEEE PES T&D CONFERENCE AND EXPOSITION, 2014,
  • [26] A deep learning-based automated framework for functional User Interface testing
    Khaliq, Zubair
    Farooq, Sheikh Umar
    Khan, Dawood Ashraf
    INFORMATION AND SOFTWARE TECHNOLOGY, 2022, 150
  • [27] A deep learning-based automated framework for functional User Interface testing
    Khaliq, Zubair
    Farooq, Sheikh Umar
    Khan, Dawood Ashraf
    INFORMATION AND SOFTWARE TECHNOLOGY, 2022, 150
  • [28] Automated Testing of Graphics Units by Deep-Learning Detection of Visual Anomalies
    Faivishevsky, Lev
    Szeskin, Adi
    Muppalla, Ashwin K.
    Shwartz-Ziv, Ravid
    Ben Ari, Itamar
    Laperdon, Ronen
    Melloul, Benjamin
    Hollander, Tahi
    Hope, Tom
    Armon, Amitai
    KDD '21: PROCEEDINGS OF THE 27TH ACM SIGKDD CONFERENCE ON KNOWLEDGE DISCOVERY & DATA MINING, 2021, : 2811 - 2821
  • [29] Automated Testing of Android Applications Integrating Residual Network and Deep Reinforcement Learning
    Cai, Lizhi
    Wang, Jilong
    Cheng, Mingang
    Wang, Jin
    2021 IEEE 21ST INTERNATIONAL CONFERENCE ON SOFTWARE QUALITY, RELIABILITY AND SECURITY (QRS 2021), 2021, : 189 - 196
  • [30] Coverage Guided Differential Adversarial Testing of Deep Learning Systems
    Guo, Jianmin
    Zhao, Yue
    Song, Houbing
    Jiang, Yu
    IEEE TRANSACTIONS ON NETWORK SCIENCE AND ENGINEERING, 2021, 8 (02): : 933 - 942