Near-field deformation of a liquid interface by atomic force microscopy

被引:3
|
作者
Mortagne, C. [1 ,2 ]
Chireux, V. [1 ]
Ledesma-Alonso, R. [3 ]
Ogier, M. [1 ]
Risso, F. [1 ]
Ondarcuhu, T. [2 ]
Legendre, D. [1 ]
Tordjeman, Ph. [1 ]
机构
[1] Univ Toulouse, IMFT, CNRS, INPT,UPS,UMR 5502, 1 Allee Prof Camille Soula, F-31400 Toulouse, France
[2] CNRS, CEMES, Nanosci Grp, UPR 8011, 29 Rue Jeanne Marvig, F-31055 Toulouse 4, France
[3] Univ Quitana Roo, CONACYT, Boulevar Bahia S-N, Chetmal 77019, Quitana Roo, Mexico
关键词
FILM; PROBE;
D O I
10.1103/PhysRevE.96.012802
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
We experiment the interaction between a liquid puddle and a spherical probe by Atomic Force Microscopy (AFM) for a probe radius R ranging from 10 nm to 30 mu m. We have developed a new experimental setup by coupling an AFM with a high-speed camera and an inverted optical microscope. Interaction force-distance curves (in contact mode) and frequency shift-distance curves (in frequency modulation mode) are measured for different bulk model liquids for which the probe-liquid Hamaker constant Hpl is known. The experimental results, analyzed in the frame of the theoretical model developed in Phys. Rev. Lett. 108, 106104 (2012) and Phys. Rev. E 85, 061602 (2012), allow to determine the "jump-to-contact" critical distance dmin below which the liquid jumps and wets the probe. Comparison between theory and experiments shows that the probe-liquid interaction at nanoscale is controlled by the liquid interface deformation. This work shows a very good agreement between the theoretical model and the experiments and paves the way to experimental studies of liquids at the nanoscale.
引用
收藏
页数:7
相关论文
共 50 条
  • [41] Optically induced mass transport studied by scanning near-field optical- and atomic force microscopy
    Stiller, B
    Karageirgiev, P
    Geue, T
    Morawetz, K
    Saphiannikova, M
    Mechau, N
    Neher, D
    PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2004, 1-2 : 129 - 137
  • [42] Atomic Force and Scanning Near-Field Optical Microscopy Study of Carbocyanine Dye J-aggregates
    Prokhorov, V. V.
    Petrova, M. G.
    Kovaleva, N. N.
    Demikhov, E. I.
    CURRENT NANOSCIENCE, 2014, 10 (05) : 700 - 704
  • [43] Optical microcantilever consisting of channel waveguide for scanning near-field optical microscopy controlled by atomic force
    Niwa, T
    Mitsuoka, Y
    Kato, K
    Ichihara, S
    Chiba, N
    Shin-Ogi, M
    Nakajima, K
    Muramatsu, H
    Sakuhara, T
    JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 388 - 392
  • [44] COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    BETZIG, E
    FINN, PL
    WEINER, JS
    APPLIED PHYSICS LETTERS, 1992, 60 (20) : 2484 - 2486
  • [45] Micromachined aperture probe for combined atomic force and near-field scanning optical microscopy (AFM/NSOM)
    Drews, D
    Noell, W
    Ehrfeld, W
    Lacher, M
    Mayr, K
    Marti, O
    Serwatzy, C
    Abraham, M
    MATERIALS AND DEVICE CHARACTERIZATION IN MICROMACHINING, 1998, 3512 : 76 - 83
  • [46] Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy
    Yoshino, T
    Sugiyama, S
    Hagiwara, S
    Fukushi, D
    Shichiri, M
    Nakao, H
    Kim, JM
    Hirose, T
    Muramatsu, H
    Ohtani, T
    ULTRAMICROSCOPY, 2003, 97 (1-4) : 81 - 87
  • [47] Nanobubbles at the liquid/solid interface studied by atomic force microscopy
    Lou, ST
    Gao, JX
    Xiao, XD
    Li, XJ
    Li, GL
    Zhang, Y
    Li, MQ
    Sun, JL
    Hu, J
    CHINESE PHYSICS, 2001, 10 : S108 - S110
  • [48] NEAR-FIELD OPTICAL MICROSCOPY IN TRANSMISSION AND REFLECTION MODES IN COMBINATION WITH FORCE MICROSCOPY
    VANHULST, NF
    MOERS, MHP
    BOLGER, B
    JOURNAL OF MICROSCOPY-OXFORD, 1993, 171 : 95 - 105
  • [49] SHEAR FORCE MICROSCOPY WITH CAPACITANCE DETECTION FOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    LEONG, JK
    WILLIAMS, CC
    APPLIED PHYSICS LETTERS, 1995, 66 (11) : 1432 - 1434
  • [50] Fluorescence lifetime of a molecule near a corrugated interface: application to near-field microscopy
    Parent, G
    Van Labeke, D
    Barchiesi, D
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1999, 16 (04) : 896 - 908