Design of Electronic Devices Stress Testing System with Charging Line Based Impulse Generator

被引:0
|
作者
Kirichenko, M., V [1 ]
Drozdov, A. N. [1 ]
Zaitsev, R., V [1 ]
Khrypunov, G. S. [1 ]
Drozdova, A. A. [1 ]
Zaitseva, L., V [1 ]
机构
[1] Natl Tech Univ Kharkiv Polytech Inst, Mat Elect & Solar Cells Dept, Kharkiv, Ukraine
关键词
charging line; EMP; nanosecond pulse; impulse generator; microcontroller;
D O I
10.1109/khpiweek51551.2020.9250146
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Systems based on the charging line are one of the most suitable designs of electromagnetic pulses generators for building up test lines of electronic devices. Such cable-based charging lines in combine with fast switching triggers will allow generating electromagnetic impulses with nanosecond duration and rising time at a level of 1 nanosecond. The amplitude of impulse directly depends from the cable charge voltage and equal half of its value. Therefore, control and setting up of generator with such parameters are quite difficult task In present work this problem was solved by design microcontroller based electronic devices stress testing system, which includes control and power supply units for charging line generator. By using microcontroller as a control center we concentrate in one device the possibility to charge line in the range from 40 to 400 V with steps no more than 1 V, realize like manual start of a single pulse and automatic controlled regime with series of impulses and ensures necessary for safety indications of device working regimes.
引用
收藏
页码:38 / 42
页数:5
相关论文
共 50 条
  • [21] An intelligent system for harmonic distortions detection in wind generator power electronic devices
    Jove, Esteban
    Manuel Gonzalez-Cava, Jose
    Casteleiro-Roca, Jose-Luis
    Alaiz-Moreton, Hector
    Baruque, Bruno
    Leitao, Paulo
    Mendez Perez, Juan Albino
    Luis Calvo-Rolle, Jose
    NEUROCOMPUTING, 2021, 456 : 609 - 621
  • [22] The use of condition maps in the design and testing of power electronic circuits and devices
    Bryant, Angus T.
    Parker-Allotey, Nii-Adotei
    Palmer, Patrick R.
    IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2007, 43 (04) : 902 - 910
  • [23] The use of condition maps in the design and testing of power electronic circuits and devices
    Bryant, A
    Parker-Allotey, NA
    Palmer, PR
    CONFERENCE RECORD OF THE 2004 IEEE INDUSTRY APPLICATIONS CONFERENCE, VOLS 1-4: COVERING THEORY TO PRACTICE, 2004, : 2520 - 2527
  • [24] Design of Low-frequency Noise Measurement System for Electronic Devices Based on FPGA
    Zhang Yuan
    Zhou Qiuzhan
    Liao Jie
    Wu Dan'e
    PROCEEDINGS OF THE SECOND INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION, VOLS 1-2, 2008, : 524 - 527
  • [25] An Efficient Multiple-Parity Generator Design for On-Line Testing on FPGA
    Fiser, Petr
    Kubalik, Pavel
    Kubatova, Hana
    11TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN - ARCHITECTURES, METHODS AND TOOLS : DSD 2008, PROCEEDINGS, 2008, : 96 - 99
  • [26] Comparative Testing of Devices in a Spherical Near Field System and Plane Wave Generator
    Scattone, F.
    Sekuljica, D.
    Giacomini, A.
    Saccardi, F.
    Scannavini, A.
    Foged, L. J.
    Kaverine, E.
    Gross, N.
    Iversen, P. O.
    2019 41ST ANNUAL SYMPOSIUM OF THE ANTENNA MEASUREMENT TECHNIQUES ASSOCIATION (AMTA 2019), 2019,
  • [27] Study on testing system of generator platform based on Ethernet
    Tao, Qian
    Advances in Information Sciences and Service Sciences, 2012, 4 (19): : 114 - 121
  • [28] User Testing and Trustworthy Electronic Voting System Design
    Silhavy, Petr
    Silhavy, Radek
    Prokopova, Zdenka
    MODERN TRENDS AND TECHNIQUES IN COMPUTER SCIENCE (CSOC 2014), 2014, 285 : 619 - 629
  • [29] Design and Implementation of Thermoelectric energy Harvesting System with Thermoelectric Generator for Automobiles Battery Charging
    Solanki, Suraj Suryakant
    Chavan, Abhay Balkrishna
    Tharwal, Omkar Nandkumar
    Ghadi, Triveni Mohan
    Sawant, Siddhesh P.
    Bondre, Sumit Sakharam
    PROCEEDINGS OF THE 2018 SECOND INTERNATIONAL CONFERENCE ON INVENTIVE COMMUNICATION AND COMPUTATIONAL TECHNOLOGIES (ICICCT), 2018, : 131 - 134
  • [30] Design of auto testing system for multifunctional electronic component
    Yao, XX
    Huang, JT
    ISTM/99: 3RD INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, 1999, : 451 - 453