共 50 条
- [33] Analysis of a novel self-aligned elevated source drain metal-oxide-semiconductor field-effect transistor with reduced gate-induced drain leakage current and high driving capability Kim, Kyung-Whan, 2000, JJAP, Tokyo (39):
- [34] Analysis of a novel self-aligned elevated source drain metal-oxide-semiconductor field-effect transistor with reduced gate-induced drain leakage current and high driving capability JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (11): : 6208 - 6211
- [39] Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology 2007 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT, 2007, : 70 - +