Void discharge behaviours as a function of cavity size and voltage waveform under very low-frequency excitation

被引:14
|
作者
Hong Viet Phuong Nguyen [1 ,2 ]
Bao Toan Phung [1 ]
机构
[1] Univ New South Wales, Sch Elect Engn & Telecommun, Sydney, NSW, Australia
[2] Univ Sci & Technol, Fac Elect Engn, Univ Danang, Danang, Vietnam
来源
HIGH VOLTAGE | 2018年 / 3卷 / 02期
关键词
partial discharge measurement; void discharge behaviours; cavity size function; voltage waveform; very low-frequency excitation; PD measurement; electrical insulation; high-voltage power equipment; PD behaviours; low-frequency voltage excitation; PD characteristics; VLF excitation; applied voltage waveforms; trapezoid-based waves; cavity size; cylindrical void; solid insulation; discharge activities; power frequency; voltage rise; DIELECTRIC MATERIAL; PD;
D O I
10.1049/hve.2017.0174
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Measurement of partial discharge (PD) is a vital method to assess the health of the electrical insulation in high-voltage power equipment. As diagnostic testing at very low frequency (VLF) is increasingly being used, it is important to investigate PD behaviours under such a low-frequency voltage excitation. This study presents the PD characteristics at VLF excitation under different applied voltage waveforms, including sinusoidal and trapezoid-based waves. Also, the effects of cavity size on PD behaviours at VLF are investigated. Experiments were performed to measure PDs in a cylindrical void bounded by solid insulation. The results show that discharge activities at VLF, in general, exhibit lower magnitude and repetition rate when compared with power frequency. Also revealed is the strong dependency of discharge parameters on the rate of voltage rise. Physical mechanisms to explain discharge behaviours are given.
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页码:96 / 102
页数:7
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