Transmission Line Signal Radiation Pattern by Near-Field Measurement

被引：0
|
作者：
Chou, Min [1 ]
Liang, Kai-Wen [1 ]
Tu, Meng-Hua [1 ]
Wu, Sung-Mao [1 ]
机构：
[1] Natl Univ Kaohsiung, Dept Elect Engn, Micro Elect Packaging Lab, Kaohsiung, Taiwan
来源：
2017 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP) | 2017年
关键词：
SSN; LabVIEW; Near-field measurement instrument;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In recent years, the chip a clock rate and current density become smaller a higher and faster. Above all, that will course the "Simultaneous Switching Noise"(SSN) more severe on the power or ground plane. This paper focuses on how to know the situation in the DUT when the SSN problem happen. So, this research find a way to create a animation with the time-varying magnetic field in the DUT by the near field measurement(EM-Isight) and the programing software (Labview).
引用
收藏
页码：239 / 242
页数：4
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