Development of in-plane and out-of-plane deformation simultaneous measurement method by using only two speckle patterns

被引:0
|
作者
Arai, Yasuhiko [1 ]
机构
[1] Kansai Univ, Suita, Osaka 5648680, Japan
关键词
Electric speckle pattern interferometry; High resolution deformation measurement; In-plane and out-of-plane deformation simultaneous measurement; FOURIER-TRANSFORM METHOD; FRINGE ANALYSIS METHOD; DISPLACEMENT MEASUREMENT; PHASE GRADIENTS; INTERFEROMETRY; INTENSITY; ESPI;
D O I
10.1117/12.2050113
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The deformation measurement method by using only two speckle patterns has been proposed in ESPI by using Fourier transform. In this paper, a new optical system which can measure precisely an in-plane and out-of-plane deformation of the object with rough surfaces is developed by using the proposed deformation measurement method. The in-plane deformation can be generally detected by using the two-beam speckle interferometer. Then, the measurement method for improving measuring accuracy using the new optical system has been discussed. The proposed optical system can also measure simultaneously the in-plane and out-of-plane deformations using two cameras and one beam. The analyzing algorithm, which can separate each component of the in-plane and out-of-plane deformations, is also proposed. Speckle patterns from each camera before and after the deformation are analyzed in order to detect the phase maps as the deformation information. Then, the optical path distance distribution before and after deformation in each camera is detected. Finally, the in-plane and out-of-plane deformations can be measured independently by using a pair of the optical path distance results based on the geometry of two cameras. From experimental results, it is confirmed that the new method can analyze a pair of in-plane and out-of-plane deformation simultaneously and independently in a high resolution power.
引用
收藏
页数:8
相关论文
共 50 条
  • [21] In-plane and out-of-plane particle velocity measurement using electromagnetic acoustical transducers
    Jian, X
    Dixon, S
    Palmer, SB
    2005 IEEE ULTRASONICS SYMPOSIUM, VOLS 1-4, 2005, : 1276 - 1279
  • [22] Measurement of in-plane and out-of-plane displacements for ultrasonic flaw detection
    Dong, FZ
    Atherton, K
    Pierce, G
    Culshaw, B
    FIFTH EUROPEAN CONFERENCE ON SMART STRUCTURES AND MATERIALS, 2000, 4073 : 324 - 331
  • [23] Automated system for interferometric out-of-plane and in-plane microelements measurement
    Kacperski, J
    Sykula, T
    Kujawinska, M
    Salbut, L
    PHOTONICS APPLICATIONS IN ASTRONOMY, COMMUNICATIONS, INDUSTRY, AND HIGH-ENERGY PHYSICS EXPERIMENTS, 2003, 5125 : 427 - 433
  • [24] Simultaneous quantitative evaluation of in-plane and out-of-plane deformation by use of a carrier method of large image-shearing shearography
    College of Physics and Electronics, Shandong Normal University, Ji'nan 250014, China
    不详
    Chin. Opt. Lett., 2006, 12 (709-711):
  • [25] Simultaneous quantitative evaluation of in-plane and out-of-plane deformation by use of a carrier method of large image-shearing shearography
    孙平
    刘瑞金
    韩青
    王晓凤
    ChineseOpticsLetters, 2006, (12) : 709 - 711
  • [26] Simultaneous measurement of in-plane and out-of-plane displacement derivatives using dual-wavelength digital holographic interferometry
    Rajshekhar, Gannavarpu
    Gorthi, Sai Siva
    Rastogi, Pramod
    APPLIED OPTICS, 2011, 50 (34) : H16 - H21
  • [27] A Technical Review on State of the Art In-Plane and Out-of-Plane Deformation Measurement Techniques for Microelectronic Packages
    Deo, Karthik Arun
    Yin, Pengcheng
    Yang, Junbo
    Ha, Jong Hwan
    Park, S. B.
    2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC, 2023, : 907 - 913
  • [28] Two-dimensional encoder with independent in-plane and out-of-plane detection for nanometric measurement
    Wu, Ping
    Yang, Zhiyong
    Wang, Xianying
    Zhang, Zhigang
    OPTICS LETTERS, 2020, 45 (15) : 4200 - 4203
  • [29] Simultaneous measurement of out-of-plane and in-plane displacements by phase-shifting digital holographic interferometry
    Okazawa, S.
    Fujigaki, M.
    Morimoto, Y.
    Matui, T.
    Advances in Experimental Mechanics IV, 2005, 3-4 : 223 - 228
  • [30] Measurement of out-of-plane deformation of curved objects with digital speckle pattern interferometry
    李鹏飞
    蔡萍
    隆军
    刘持越
    闫浩
    Chinese Optics Letters, 2018, 16 (11) : 44 - 50