Silicon metal-oxide-semiconductor field effect transistor/field emission array fabricated using chemical mechanical polishing

被引:9
|
作者
Hong, CY [1 ]
Akinwande, AI [1 ]
机构
[1] MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2003年 / 21卷 / 01期
关键词
D O I
10.1116/1.1527651
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An integrated lightly doped drain-metal-oxide-semiconductor field effect transistor (LD-MOSFET) is used to control the electron supply of a silicon field emission array (FEA), resulting in low voltage switching and stabilization of emission current. The LD-MOSFET-driven field emission array was fabricated using isotropic and anisotropic etching of silicon, oxidation sharpening, chemical vapor deposition, and chemical mechanical polishing. Current-voltage characterization of the LD-MOSFET-driven FEA demonstrated modulation of electron emission by the MOSFET gate voltage and the reduction of current fluctuation. (C) 2003 American Vacuum Society.
引用
收藏
页码:500 / 505
页数:6
相关论文
共 50 条
  • [21] Rapid thermal chemical vapor deposition of zirconium oxide for metal-oxide-semiconductor field effect transistor application
    Chang, JP
    Lin, YS
    Chu, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (05): : 1782 - 1787
  • [22] Quantum transport in a nanosize silicon-on-insulator metal-oxide-semiconductor field-effect transistor
    Croitoru, M.D. (devreese@uia.ua.ac.be), 1600, American Institute of Physics Inc. (93):
  • [23] Quantum transport in a nanosize silicon-on-insulator metal-oxide-semiconductor field-effect transistor
    Croitoru, MD
    Gladilin, VN
    Fomin, VM
    Devreese, JT
    Magnus, W
    Schoenmaker, W
    Sorée, B
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (02) : 1230 - 1240
  • [24] Radiation induced parasitic effect in silicon-on-insulator metal-oxide-semiconductor field-effect transistor
    Peng Chao
    En Yun-Fei
    Li Bin
    Lei Zhi-Feng
    Zhang Zhan-Gang
    He Yu-Juan
    Huang Yun
    ACTA PHYSICA SINICA, 2018, 67 (21)
  • [25] Temperature effects of γ-irradiated metal-oxide-semiconductor field-effect-transistor
    Wang, Jian-Ping
    Xu, Na-Jun
    Zhang, Ting-Qing
    Tang, Hua-Lian
    Liu, Jia-Lu
    Liu, Chuan-Yang
    Yao, Yu-Juan
    Peng, Hong-Lun
    He, Bao-Ping
    Zhang, Zheng-Xuan
    Wuli Xuebao/Acta Physica Sinica, 2000, 49 (07):
  • [26] Temperature effects of γ-irradiated metal-oxide-semiconductor field-effect-transistor
    Wang, JP
    Xu, NJ
    Zhang, TQ
    Tang, HL
    Liu, JL
    Liu, CY
    Yao, YJ
    Peng, HL
    He, BP
    Zhang, ZX
    ACTA PHYSICA SINICA, 2000, 49 (07) : 1331 - 1334
  • [27] The demonstration of the magnetic Ge metal-oxide-semiconductor field-effect transistor
    Liao, M. -H.
    Huang, S. -C.
    AIP ADVANCES, 2015, 5 (02):
  • [28] Ballistic quantum transport in a nanoscale metal-oxide-semiconductor field effect transistor
    Arora, Vijay K.
    Tan, Michael L. P.
    Saad, Ismail
    Ismail, Razali
    APPLIED PHYSICS LETTERS, 2007, 91 (10)
  • [29] Probing the density of states in a metal-oxide-semiconductor field-effect transistor
    Calvet, L. E.
    Snyder, J. P.
    Wernsdorfer, W.
    PHYSICAL REVIEW B, 2008, 78 (19)
  • [30] OPTICAL SPECTROSCOPY AND FIELD-ENHANCED EMISSION OF AN OXIDE TRAP INDUCED BY HOT-HOLE INJECTION IN A SILICON METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR
    BOURCERIE, M
    MARCHETAUX, JC
    BOUDOU, A
    VUILLAUME, D
    APPLIED PHYSICS LETTERS, 1989, 55 (21) : 2193 - 2195