Development of Passive Near-field Spectroscopy for Thermal Evanescent Wave

被引：0
|
作者：
Sakuma, Ryoko [1 ]
Lin, Kuan-Ting [2 ]
Kim, Sunmi [3 ]
Kimura, Fuminobu [1 ,2 ]
Kajihara, Yusuke [1 ,2 ]
机构：
[1] Univ Tokyo, Dept Precis Engn, Bunkyo Ku, Tokyo 1138656, Japan
[2] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
[3] Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan
来源：
2020 45TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2020年
关键词：
D O I：
10.1109/IRMMW-THZ46771.2020.9370651
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The local dynamics on materials generate thermal evanescent waves that are strongly localized on material surfaces. Sensing the thermal evanescent waves with scattering-type scanning near-field optical microscopy (s-SNOM) without any external light sources enables imaging of the local dynamics at the nanoscale. Here, we report passive THz scanning near-field optical spectroscopy (SNOS), in which a wavelength selective mechanism was constructed on s-SNOM. We have achieved detecting far-field spectrum at wavelengths of 8.0 - 15.5 mu m and broadband near-field signals of an Au/SiC sample at room temperature. The spectrum of the thermal evanescent wave enables a detailed analysis of the material surface.
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页数：2
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