Coupled surface and bulk diffusion in crystals

被引:0
|
作者
Kosolobov, S. S. [1 ]
机构
[1] Skolkovo Inst Sci & Technol, Ctr Engn Phys, Bolshoy Blvd 30,bld 1, Moscow 121205, Russia
关键词
POINT-DEFECTS; SUBSURFACE; IMPURITIES; KINETICS; STEPS;
D O I
10.1063/5.0091072
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We analyze point defect bulk and surface diffusion near the crystal-vacuum interface and show that bulk diffusion is coupled with surface diffusion via the atomic processes in the intermediate subsurface layer. A set of self-contained differential equations describing the interaction of self-interstitials and bulk vacancies with the surface of crystal is proposed. The results show the existence of the fundamental relation between the equilibrium concentrations of the point defects in bulk and at the surface of the crystal. For the case of silicon, the energy barrier differences that restrict the point defect fluxes between the bulk and surface of the crystal are estimated. (C) 2022 Author(s)
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页数:5
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