Structural and optoelectronic properties of germanium-rich islands grown on silicon using molecular beam epitaxy

被引:9
|
作者
Nataraj, L. [1 ]
Sustersic, N. [1 ]
Coppinger, M. [1 ]
Gerlein, L. F. [1 ]
Kolodzey, J. [1 ]
Cloutier, S. G. [1 ,2 ]
机构
[1] Univ Delaware, Dept Elect & Comp Engn, Newark, DE 19716 USA
[2] Univ Delaware, Delaware Biotechnol Inst, Newark, DE 19711 USA
基金
美国国家科学基金会;
关键词
elemental semiconductors; germanium; island structure; molecular beam epitaxial growth; photoconductivity; photoelectricity; photoemission; photoluminescence; Raman spectra; semiconductor growth; silicon; OPTICAL GAIN; LASER;
D O I
10.1063/1.3371759
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the structural and optoelectronic properties of self-assembled germanium-rich islands grown on silicon using molecular beam epitaxy. Raman, photocurrent, photoluminescence, and transient optical spectroscopy measurements suggest significant built-in strains and a well-defined interface with little intermixing between the islands and the silicon. The shape of these islands depends on the growth conditions and includes pyramid, dome, barn-shaped, and superdome islands. Most importantly, we demonstrate that these germanium-rich islands provide efficient light emission at telecommunication wavelengths on a complementary metal-oxide semiconductor-compatible platform.
引用
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页数:3
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