Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy

被引:4
|
作者
Stohmann, Patrick [1 ]
Koch, Sascha [1 ]
Yang, Yang [1 ,2 ]
Kaiser, Christopher David [1 ]
Ehrens, Julian [3 ]
Schnack, Juergen [3 ]
Biere, Niklas [4 ]
Anselmetti, Dario [4 ]
Goelzhaeuser, Armin [1 ]
Zhang, Xianghui [1 ]
机构
[1] Univ Bielefeld, Phys Supramol Syst & Surfaces, Fac Phys, D-33615 Bielefeld, Germany
[2] Imperial Coll London, Dept Chem Engn, London SW7 2AZ, England
[3] Univ Bielefeld, Condensed Matter Theory Grp, Fac Phys, D-33615 Bielefeld, Germany
[4] Univ Bielefeld, Expt Biophys & Appl Nanosci, Fac Phys, D-33615 Bielefeld, Germany
基金
欧盟地平线“2020”;
关键词
carbon nanomembranes; electron-induced cross-linking; scanning tunneling microscopy; self-assembled monolayers; subnanometerpores; CARBON NANOMEMBRANES; TERPHENYLTHIOL; IRRADIATION; POLYMORPHISM; MOLECULES; MECHANISM; SURFACES; AU(111); METALS;
D O I
10.3762/bjnano.13.39
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Ultrathin membranes with subnanometer pores enabling molecular size-selective separation were generated on surfaces via electron-induced cross-linking of self-assembled monolayers (SAMs). The evolution of p-terphenylthiol (TPT) SAMs on Au(111) surfaces into cross-linked monolayers was observed with a scanning tunneling microscope. As the irradiation dose was increased, the cross- linked regions continued to grow and a large number of subnanometer voids appeared. Their equivalent diameter is 0.5 +/- 0.2 nm and the areal density is approximate to 1.7 x 10(17) m(-2). Supported by classical molecular dynamics simulations, we propose that these voids may correspond to free volumes inside a cross-linked monolayer.
引用
收藏
页码:462 / 471
页数:10
相关论文
共 50 条
  • [41] Communication: Scanning tunneling microscopy study of the reaction of octanethiolate self-assembled monolayers with atomic chlorine
    Jobbins, Matthew M.
    Lee, David Y.
    Kandel, S. Alex
    JOURNAL OF CHEMICAL PHYSICS, 2012, 136 (14):
  • [42] Dynamics in Self-assembled Organic Monolayers at the Liquid/Solid Interface Revealed by Scanning Tunneling Microscopy
    De Feyter, Steven
    Xu, Hong
    Mali, Kunal
    CHIMIA, 2012, 66 (1-2) : 38 - 43
  • [43] SCANNING ELECTRON-MICROSCOPY CAN FORM IMAGES OF PATTERNS IN SELF-ASSEMBLED MONOLAYERS
    LOPEZ, GP
    BIEBUYCK, HA
    WHITESIDES, GM
    LANGMUIR, 1993, 9 (06) : 1513 - 1516
  • [44] Scanning tunneling microscopy study of imaging change induced by electric field change of bipyridine derivatives in self-assembled monolayers
    Ishida, T
    Koyama, E
    Tokuhisa, H
    Belaissaoui, A
    Nagawa, Y
    Nakano, M
    Mizutani, W
    Kanesato, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2004, 43 (7B): : 4561 - 4565
  • [46] Amplified cross-linking efficiency of self-assembled monolayers through targeted dissociative electron attachment for the production of carbon nanomembranes
    Koch, Sascha
    Kaiser, Christopher D.
    Penner, Paul
    Barclay, Michael
    Frommeyer, Lena
    Emmrich, Daniel
    Stohmann, Patrick
    Abu-Husein, Tarek
    Terfort, Andreas
    Fairbrother, D. Howard
    Ingolfsson, Oddur
    Goelzhaeuser, Armin
    BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2017, 8 : 2562 - 2571
  • [47] Imaging of patterned self-assembled monolayers by scanning photoelectron microscopy
    Klauser, R
    Zharnikov, M
    Hong, IH
    Wang, SC
    Gölzhäuser, A
    Chuang, TJ
    JOURNAL DE PHYSIQUE IV, 2003, 104 : 459 - 462
  • [48] SCANNING SURFACE HARMONIC MICROSCOPY OF SELF-ASSEMBLED MONOLAYERS ON GOLD
    MIZUTANI, W
    MICHEL, B
    SCHIERLE, R
    WOLF, H
    ROHRER, H
    APPLIED PHYSICS LETTERS, 1993, 63 (02) : 147 - 149
  • [49] Elastic and inelastic electron tunneling in alkane self-assembled monolayers
    Wang, WY
    Lee, T
    Reed, MA
    JOURNAL OF PHYSICAL CHEMISTRY B, 2004, 108 (48): : 18398 - 18407
  • [50] Scanning tunneling microscopy of chiral pair self assembled monolayers.
    Cai, YG
    Bernasek, SL
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2002, 224 : U431 - U431