Comprehensive Study of Copper Nano-paste for Cu-Cu Bonding

被引:2
|
作者
Chong, Ser Choong [1 ]
Sharon, Pei Siang Lim [1 ]
机构
[1] ASTAR, Inst Microelect, 2 Fusionopolis Way,08-02 Innovis Tower, Singapore 138634, Singapore
关键词
Cu nano-paste; Cu micro-bump; Formic acid; PITCH;
D O I
10.1109/ECTC.2019.00036
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cu-Cu bond is a prefer solution for shrinking interconnect pitch as it offered lower interconnect resistance with no intermetallic compound risk. Major challenge in Cu-Cu bond is the formation of copper oxide and also the long thermal process. Several approaches had been proposed in the industry to overcome the challenges are diffusion bonding, ultra-sonic bonding, Cu nano-paste, use of Formic acid and argon plasma for copper surface treatment and bit grinding process to enable good Cu-Cu bond. In this paper, we explore the use of Cu nano-paste as the bonding medium between Cu bump and Cu pad. Cu nano-paste is an attractive solution for Cu-Cu bond as it deploy similar approach as conventional solder bump flip chip process. The flux used in conventional solder bump flip chip process is replaced by Cu nano-paste and the conventional reflow oven is replaced by Formic Acid Chamber. We had demonstrated good formic acid process in dealing with Cu nano-paste in terms of low resistance value and prestige copper surface.
引用
收藏
页码:191 / 196
页数:6
相关论文
共 50 条
  • [21] Impacts of Misalignment on Bonding Strength of Cu-Cu Hybrid Bonding
    Furuse, Shunsuke
    Fujii, Nobutoshi
    Kotoo, Kengo
    Ogawa, Naoki
    Yamada, Taichi
    Hirano, Takaaki
    Saito, Suguru
    Hagimoto, Yoshiya
    Iwamoto, Hayato
    2021 7TH INTERNATIONAL WORKSHOP ON LOW TEMPERATURE BONDING FOR 3D INTEGRATION (LTB-3D), 2021, : 22 - 22
  • [22] Modeling of Cu-Cu Thermal Compression Bonding
    Shie, Kai-Cheng
    Tran, Dinh-Phuc
    Gusak, A. M.
    Tu, K. N.
    Liu, Hung-Che
    Chen, Chih
    IEEE 72ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2022), 2022, : 2201 - 2205
  • [23] State of the Art of Cu-Cu Hybrid Bonding
    Lau, John H.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2024, 14 (03): : 376 - 396
  • [24] Effect of Nanotwin Boundary on the Cu-Cu Bonding
    Lu, Tsan-Feng
    Lai, Tung-Yen
    Chu, Yi Yang
    Wu, YewChung Sermon
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2021, 10 (07)
  • [25] Novel Cu-Cu Bonding Technique: The Insertion Bonding Approach
    Okoro, Chukwudi
    Limaye, Paresh
    Agarwal, Rahul
    Vandevelde, Bart
    Beyne, Eric
    Vandepitte, Dirk
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2011, 1 (12): : 1885 - 1894
  • [26] Cu-Cu direct bonding in air by in-situ reduction of copper oxide with glycerol
    Wang, Xiaocun
    Han, Shuo
    Xiao, Fei
    APPLIED SURFACE SCIENCE, 2024, 659
  • [27] Cu-Cu Bonding with Cu Nanowire Arrays for Electronics Integration
    Jiang, Han
    Robertson, Stuart
    Zhou, Zhaoxia
    Liu, Changqing
    2020 IEEE 8TH ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE (ESTC), 2020,
  • [28] Low-Temperature Cu-Cu Wafer Bonding
    Rebhan, B.
    Hesser, G.
    Duchoslav, J.
    Dragoi, V.
    Wimplinger, M.
    Hingerl, K.
    SEMICONDUCTOR WAFER BONDING 12: SCIENCE, TECHNOLOGY, AND APPLICATIONS, 2012, 50 (07): : 139 - 149
  • [29] Shape Synergy of Ag@Cu Chip Packaging Nano-Paste and Its Sintering Reliability
    Yin, Changhao
    Guo, Wei
    Zhao, Wenyi
    Zhang, Cheng
    Peng, Zilong
    Zou, Guisheng
    Jia, Qiang
    Zhang, Hongqiang
    ADVANCED ENGINEERING MATERIALS, 2025, 27 (01)
  • [30] Study of Cu-Cu low temperature direct bonding and contact resistance measurement on bonding interface
    Yang, Wenhua
    Lu, Yangting
    Zhou, Chenggong
    Zhang, Jian
    Tadatomo, Suga
    2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017, : 1466 - 1469