Temporal treatment of a thermal response for defect depth estimation

被引：0
|
作者：
Plotnikov, YA [1 ]
Winfree, WP [1 ]
机构：
[1] NASA, Langley Res Ctr, Hampton, VA 23681 USA
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 19A AND 19B | 2000年 / 509卷
关键词：
D O I：
暂无
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
引用
收藏
页码：587 / 594
页数：8
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