In-situ NMR applications in process chemistry

被引：0
|
作者：
Reamer, Robert A. [1 ]
机构：
[1] Merck Res Labs, Dept Proc Chem, Rahway, NJ 07065 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2014年 / 248卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
860-ORGN
引用
收藏
页数：1
相关论文
共 50 条
  • [21] APPLICATIONS OF NMR SPECTROSCOPY IN ORGANIC CHEMISTRY
    STAMM, O
    CHIMIA, 1965, 19 (02) : 94 - &
  • [22] APPLICATIONS OF NMR SPECTROSCOPY IN ORGANIC CHEMISTRY
    不详
    TRANSACTIONS OF THE FARADAY SOCIETY, 1965, 61 (512P): : 1816 - &
  • [23] NMR for microbiology: In vivo and in situ applications
    Grivet, Jean-Philippe
    Delort, Anne-Marie
    PROGRESS IN NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY, 2009, 54 (01) : 1 - 53
  • [24] APPLICATIONS OF NMR SPECTROSCOPY IN ORGANIC CHEMISTRY
    LUFT, R
    BULLETIN DE LA SOCIETE CHIMIQUE DE FRANCE, 1965, (05): : 1613 - +
  • [25] In-situ Observation of Underfill Dispensing Process
    Hu, Dyi Chung
    Hao Chen, Erh
    Lee, Jeffrey Changbing
    Peng Sun, Chia
    Liang, Yu En
    2023 International Conference on Electronics Packaging, ICEP 2023, 2023, : 57 - 58
  • [26] In-situ process control for semiconductor manufacturing
    Taylor, JH
    Whidden, TK
    Zhao, XZ
    PROCEEDINGS OF THE 2002 AMERICAN CONTROL CONFERENCE, VOLS 1-6, 2002, 1-6 : 2180 - 2185
  • [27] AN IN-SITU SOLVENT RECYCLING PROCESS FOR SPPS
    Collins, J.
    Singh, S.
    Porter, K.
    Karney, M.
    JOURNAL OF PEPTIDE SCIENCE, 2016, 22 : S60 - S60
  • [28] Investigation of the gelation process by in-situ interferometry
    Guan, Y
    Chen, Q
    Zhang, XM
    Peng, YX
    Xu, J
    MACROMOLECULAR RAPID COMMUNICATIONS, 2000, 21 (14) : 998 - 1001
  • [29] In-situ characterization of the electrophoretic deposition process
    Tabellion, J
    Clasen, R
    INNOVATIVE PROCESSING AND SYNTHESIS OF CERAMICS, GLASSES, AND COMPOSITES IV, 2000, 115 : 197 - 208
  • [30] An in-situ monitoring system on the grinding process
    Kim, ByoungChang
    Kwon, MinCheol
    Ha, JaeBoong
    Lee, KangWoo
    OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS, 2010, 7855
12345