Laser-induced structure defects and their use for modification of properties of (Cd,Hg)Te epitaxial layers and CdTe crystals

被引:1
|
作者
Kotlyarchuk, BK [1 ]
Zaginey, AO [1 ]
Syvenkyy, YE [1 ]
机构
[1] Natl Acad Sci Ukraine, Inst Appl Problems Mech & Math, UA-79060 Lvov, Ukraine
来源
VLSI CIRCUITS AND SYSTEMS | 2003年 / 5117卷
关键词
laser; modification; structure; defect; mercury-cadmium telluride;
D O I
10.1117/12.498538
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This Paper examines the experimental researches of structural defect generation in (Cd,Hg)Te epitaxial layers on CdTe substrates and CdTe mono-crystals after pulse laser treatment and the influence of these defects on mechanical, optical and galvano-magnetic properties of the samples. In the experiments we used the ruby laser radiation with energy density changed in the range 1,5-15 J/cm(2). The duration of laser pulses (tau) was about 1,5 ms. Changes in the chemical composition of the irradiated surface have been analyzed by the Auger electron spectroscopy. The zones with increased defect concentration were determined by the method of the selective chemical etching. It has been determined that the pulse laser processing results in both the essential redistribution of the component concentration and generation of the point and extended defects in near-surface crystal layers excited by laser irradiation. After the laser irradiation of the samples the redistribution of the intensity of the luminescence bands and emergence of a new band were observed over the band 840 nm at the temperature of samples about 4;2 K. The essential growth of the spectral band intensity with a maximum within the band 875-885 nm at T = 77 K has been observed as well.
引用
收藏
页码:538 / 546
页数:9
相关论文
共 25 条
  • [21] Optical and electrical properties of in situ-annealed p-type Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers for applications as infrared detectors
    Ryu, YS
    Heo, YB
    Song, BS
    Yoon, SJ
    Kim, YJ
    Kang, TW
    Kim, TW
    APPLIED PHYSICS LETTERS, 2003, 83 (18) : 3776 - 3778
  • [22] Electrophysical Properties of p-Type Undoped and Arsenic-Doped Hg1-x Cd x Te Epitaxial Layers with x ≈ 0.4 Grown by the MOCVD Method
    Evstigneev, V. S.
    Varavin, V. S.
    Chilyasov, A. V.
    Remesnik, V. G.
    Moiseev, A. N.
    Stepanov, B. S.
    SEMICONDUCTORS, 2018, 52 (06) : 702 - 707
  • [23] Laser-Induced Modification of the Surface of Ge2Sb2Te5 Thin Films: Phase Changes and Periodic-Structure Formation
    S. A. Yakovlev
    A. V. Ankudinov
    Yu. V. Vorobyov
    M. M. Voronov
    S. A. Kozyukhin
    B. T. Melekh
    A. B. Pevtsov
    Semiconductors, 2018, 52 : 809 - 815
  • [24] Laser-Induced Modification of the Surface of Ge2Sb2Te5 Thin Films: Phase Changes and Periodic-Structure Formation
    Yakovlev, S. A.
    Ankudinov, A. V.
    Vorobyov, Yu. V.
    Voronov, M. M.
    Kozyukhin, S. A.
    Melekh, B. T.
    Pevtsov, A. B.
    SEMICONDUCTORS, 2018, 52 (06) : 809 - 815
  • [25] Laser-induced changes in the electrical properties and structure of polycrystalline CoSi2 and amorphous Co-Ti-Si thin layers
    Knite, M.
    Shevanovs, L.
    Snitka, V.
    Izvestiya Akademii Nauk. Ser. Fizicheskaya, 2001, 65 (04): : 502 - 506